{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,21]],"date-time":"2026-02-21T19:42:48Z","timestamp":1771702968166,"version":"3.50.1"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2018,2,1]],"date-time":"2018-02-01T00:00:00Z","timestamp":1517443200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Technical Education Quality Improvement Programme-II, Jadavpur University"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2018,2]]},"DOI":"10.1109\/tie.2017.2733490","type":"journal-article","created":{"date-parts":[[2017,7,28]],"date-time":"2017-07-28T18:18:21Z","timestamp":1501265901000},"page":"1568-1576","source":"Crossref","is-referenced-by-count":42,"title":["A Novel Leakage Current Index for the Field Monitoring of Overhead Insulators Under Harmonic Voltage"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0974-1625","authenticated-orcid":false,"given":"Riddhi","family":"Ghosh","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Biswendu","family":"Chatterjee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9479-6577","authenticated-orcid":false,"given":"Sivaji","family":"Chakravorti","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2003.1255783"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2004.1324357"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/94.798125"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CEIDP.1996.564711"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2003.1176575"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.elstat.2007.11.004"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2009.4815193"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005586"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2010.5448106"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2010.5492255"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2006.877099"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2012.6232007"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/94.971471"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2007.905833"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2002.800878"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MPER.2001.4311525"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/94.946726"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2009.2016626"},{"key":"ref1","article-title":"Insulation\n pollution monitoring","year":"1994"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2361486"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2012.2183623"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2341557"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2124670"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/19.843082"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2174532"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1002\/9780470496251"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8186327\/07995095.pdf?arnumber=7995095","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:24:55Z","timestamp":1642004695000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7995095\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,2]]},"references-count":26,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2017.2733490","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,2]]}}}