{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T15:11:37Z","timestamp":1784905897341,"version":"3.55.0"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2018,5,1]],"date-time":"2018-05-01T00:00:00Z","timestamp":1525132800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2018,5]]},"DOI":"10.1109\/tie.2017.2758752","type":"journal-article","created":{"date-parts":[[2017,10,2]],"date-time":"2017-10-02T18:43:57Z","timestamp":1506969837000},"page":"4039-4050","source":"Crossref","is-referenced-by-count":38,"title":["Online Open-Phase Fault Detection for Permanent Magnet Machines With Low Fault Harmonic Magnitudes"],"prefix":"10.1109","volume":"65","author":[{"given":"Shih-Chin","family":"Yang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yu-Liang","family":"Hsu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Po-Huan","family":"Chou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Guan-Ren","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Da-Ren","family":"Jian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2188877"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2255111"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2498613"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2388493"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2479399"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2012.02.012"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2176127"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2651113"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2228614"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/28.738983"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2444240"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2004.836157"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2010.5618459"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.926195"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2013.2287651"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2437357"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2334652"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2089937"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2207655"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2375853"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2245513"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/41.873223"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301712"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2012.0290"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2010.0052"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2337292"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/63.737592"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8260593\/08055611.pdf?arnumber=8055611","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:24:59Z","timestamp":1642004699000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8055611\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,5]]},"references-count":29,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2017.2758752","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,5]]}}}