{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,6]],"date-time":"2025-12-06T16:42:44Z","timestamp":1765039364438,"version":"3.37.3"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2018,6,1]],"date-time":"2018-06-01T00:00:00Z","timestamp":1527811200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2018,6]]},"DOI":"10.1109\/tie.2017.2772152","type":"journal-article","created":{"date-parts":[[2017,11,28]],"date-time":"2017-11-28T16:32:22Z","timestamp":1511886742000},"page":"4553-4564","source":"Crossref","is-referenced-by-count":24,"title":["Cost-Effective Current Measurement Technique for Four-Phase SRM Control by Split Dual Bus Line Without Pulse Injection and Voltage Penalty"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7563-7415","authenticated-orcid":false,"given":"Chun","family":"Gan","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0087-603X","authenticated-orcid":false,"given":"Qingguo","family":"Sun","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9763-711X","authenticated-orcid":false,"given":"Nan","family":"Jin","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7285-609X","authenticated-orcid":false,"given":"Leon M.","family":"Tolbert","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6689-4735","authenticated-orcid":false,"given":"Zhibin","family":"Ling","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1007-1617","authenticated-orcid":false,"given":"Yihua","family":"Hu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2597-5413","authenticated-orcid":false,"given":"Jianhua","family":"Wu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2217715"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/28.673713"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2257866"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2440421"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2588141"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2024661"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2002.805571"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2505706"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2364153"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2599850"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301754"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2011.2177873"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2023568"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2045212"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TTE.2017.2649883"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2343962"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2466558"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2577543"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2583467"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2123854"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2447501"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2266408"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2236106"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2549005"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2207406"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2568039"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2524415"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2533598"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2478392"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2582793"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2409052"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2389258"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2196015"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2316272"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2429557"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/28.821805"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2035456"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2510286"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8291767\/08106714.pdf?arnumber=8106714","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:26:26Z","timestamp":1642004786000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8106714\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,6]]},"references-count":38,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2017.2772152","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2018,6]]}}}