{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:48:44Z","timestamp":1761648524280,"version":"3.37.3"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2018,11,1]],"date-time":"2018-11-01T00:00:00Z","timestamp":1541030400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100000266","name":"Engineering and Physical Sciences Research Council","doi-asserted-by":"publisher","award":["EP\/K034987\/1"],"award-info":[{"award-number":["EP\/K034987\/1"]}],"id":[{"id":"10.13039\/501100000266","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2018,11]]},"DOI":"10.1109\/tie.2018.2793229","type":"journal-article","created":{"date-parts":[[2018,1,15]],"date-time":"2018-01-15T22:42:27Z","timestamp":1516056147000},"page":"9068-9078","source":"Crossref","is-referenced-by-count":30,"title":["A General Modeling Technique for a Triple Redundant 3\u2009\u00d7\u20093-Phase PMA SynRM"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5951-0089","authenticated-orcid":false,"given":"Bo","family":"Wang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4870-3744","authenticated-orcid":false,"given":"Jiabin","family":"Wang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5642-2921","authenticated-orcid":false,"given":"Antonio","family":"Griffo","sequence":"additional","affiliation":[]},{"given":"Bhaskar","family":"Sen","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2493727"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2006.876074"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2006.885125"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"986","DOI":"10.1109\/TIA.2013.2272911","article-title":"Comparison of the fault characteristics of IPM-Type and SPM-Type BLDC motors under inter-turn fault conditions using winding function theory","volume":"50","author":"kyung-tae","year":"2014","journal-title":"IEEE Trans Ind Appl"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"305","DOI":"10.1109\/TEC.2005.859979","article-title":"A field reconstruction method for optimal excitation of permanent magnet synchronous machines","volume":"21","author":"weidong","year":"2006","journal-title":"IEEE Trans Energy Convers"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2016.7854677"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2004.841516"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2004.834101"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2010.2083639"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2388200"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.1996.548786"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2266377"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2288191"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2005.1582041"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2006.892301"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2013.6647295"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"3523","DOI":"10.1109\/TIE.2011.2165453","article-title":"Overview of electric motor technologies used for more electric aircraft (MEA)","volume":"59","author":"cao","year":"2012","journal-title":"IEEE Trans Ind Electron"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2062480"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2435371"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2491884"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/60.678979"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2013.6647168"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2538321"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2003.811740"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2171175"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8395243\/08259013.pdf?arnumber=8259013","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:24:03Z","timestamp":1642004643000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8259013\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,11]]},"references-count":25,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2793229","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2018,11]]}}}