{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,17]],"date-time":"2026-10-17T17:12:41Z","timestamp":1792257161025,"version":"4.4.0"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2018]]},"DOI":"10.1109\/tie.2018.2793263","type":"journal-article","created":{"date-parts":[[2018,1,15]],"date-time":"2018-01-15T17:42:27Z","timestamp":1516038147000},"page":"1-1","source":"Crossref","is-referenced-by-count":143,"title":["Reliability and Cost based Redundancy Design for Modular Multilevel Converter"],"prefix":"10.1109","author":[{"given":"Pengfei","family":"Tu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shunfeng","family":"Yang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Peng","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2008.4591920"},{"key":"ref38","first-page":"1","article-title":"Next\n generation planar IGBTs with SPT+ technology","volume":"6","author":"rahimo","year":"2005","journal-title":"Power Electron Eur Mag"},{"key":"ref33","article-title":"MIL-HDBK-217F notice 2, military handbook-reliability prediction of electronic equipment","year":"1995"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2012.6342618"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2013.6520714"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2013.2252958"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2012.6342618"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2013.6646971"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2175670"},{"key":"ref34","article-title":"Reliability data handbook: Universal model for reliability prediction of\n electronics components, PCBs and equipment","year":"2004","journal-title":"Tech Rep IEC62380"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2392778"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2519510"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2454534"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2477834"},{"key":"ref13","first-page":"1","article-title":"Fault tolerant cell design for MMC-based\n multiport power converters","author":"zapico","year":"0","journal-title":"Proc IEEE Energy Convers Congr Expo"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2192503"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2013.6520766"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2017.7913066"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2608940"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2526684"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2632858"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2013.6646971"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2042303"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2015.7104701"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2310127"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2522190"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2308357"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2598286"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2628762"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2013.6647238"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2008.4591920"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2538201"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2003.1304403"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301712"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2211315"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2713394"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2756849"},{"key":"ref24","author":"kuo","year":"2003","journal-title":"Optimal Reliability Modeling Principles and Applications"},{"key":"ref41","first-page":"1","article-title":"System-level reliability assessment of power stage in\n fuel cell application","author":"zhou","year":"0","journal-title":"Proc IEEE Energy Convers Congr Expo"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/9781118841716"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2013.2290282"},{"key":"ref25","author":"cassandras","year":"2009","journal-title":"Introduction to Discrete Event Systems"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/4387790\/08259001.pdf?arnumber=8259001","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T17:06:33Z","timestamp":1657731993000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8259001\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018]]},"references-count":42,"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2793263","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018]]}}}