{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,15]],"date-time":"2026-06-15T10:31:21Z","timestamp":1781519481437,"version":"3.54.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61433006"],"award-info":[{"award-number":["61433006"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61272204"],"award-info":[{"award-number":["61272204"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/tie.2018.2798605","type":"journal-article","created":{"date-parts":[[2018,1,26]],"date-time":"2018-01-26T19:14:52Z","timestamp":1516994092000},"page":"8153-8162","source":"Crossref","is-referenced-by-count":126,"title":["Assessing the Physical Impact of Cyberattacks on Industrial Cyber-Physical Systems"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3577-3228","authenticated-orcid":false,"given":"Kaixing","family":"Huang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5291-5841","authenticated-orcid":false,"given":"Chunjie","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8709-5625","authenticated-orcid":false,"given":"Yu-Chu","family":"Tian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Shuanghua","family":"Yang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yuanqing","family":"Qin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2225393"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2687865"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2014.2322152"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2006.145"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2542049"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2011.34"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICDCS.Workshops.2008.40"},{"key":"ref17","first-page":"355","article-title":"Attacks against process control\n systems: Risk assessment, detection, and response","author":"c\u00e1rdenas","year":"0","journal-title":"Proc 6th ACM Symp Inf Comput Commun Security"},{"key":"ref18","first-page":"213","author":"leversage","year":"2007","journal-title":"Comparing Electronic Battlefields Using Mean Time-To-Compromise as a Comparative Security Metric"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0888-613X(01)00039-1"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/2461446.2461465"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2014.2364709"},{"key":"ref6","first-page":"296","article-title":"Cyber security\n risk evaluation of a nuclear I&C system using Bayesian networks and event trees","volume":"49","author":"shin","year":"2016","journal-title":"Nucl Eng Technol"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2015.02.008"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.cose.2016.01.001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2015.2503399"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2011.2165689"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2017.2648857"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1111\/j.1539-6924.2008.01151.x"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CRISIS.2012.6378942"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/RTEST.2015.7369840"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/0005-1098(87)90037-9"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2005.03.007"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8365919\/08270567.pdf?arnumber=8270567","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,26]],"date-time":"2022-01-26T04:58:23Z","timestamp":1643173103000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8270567\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":23,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2798605","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,10]]}}}