{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T15:12:25Z","timestamp":1774624345749,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/tie.2018.2803780","type":"journal-article","created":{"date-parts":[[2018,2,8]],"date-time":"2018-02-08T19:08:26Z","timestamp":1518116906000},"page":"8239-8249","source":"Crossref","is-referenced-by-count":58,"title":["A High Accuracy Imaging and Measurement System for Wheel Diameter Inspection of Railroad Vehicles"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4167-6253","authenticated-orcid":false,"given":"Mehran","family":"Torabi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2835-3265","authenticated-orcid":false,"given":"S. G. Mohammad","family":"Mousavi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Davood","family":"Younesian","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2014.6798521"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2183833"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2146215"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/41.499808"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2521346"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/41.43014"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.2174\/1874110X00802010057"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CIHSPS.2006.313313"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2011.2119110"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2011.05.014"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2524459"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlastec.2014.07.004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2188875"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijleo.2011.04.023"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/41.170971"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1364\/AO.55.000198"},{"key":"ref6","year":"2017"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/41.681235"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.3390\/s120100334"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2405494"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0262-8856(02)00152-X"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2013.09.005"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.1930.896476"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.903583"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCC.2007.893278"},{"key":"ref22","year":"2017"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2004.01.008"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1117\/1.2897237"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.rcim.2007.02.005"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/41.887964"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/34.824819"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8365919\/08286879.pdf?arnumber=8286879","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:18:13Z","timestamp":1642004293000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8286879\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":31,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2803780","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,10]]}}}