{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T15:38:19Z","timestamp":1780501099479,"version":"3.54.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2018,12,1]],"date-time":"2018-12-01T00:00:00Z","timestamp":1543622400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Ministry of Science, ICT, and Future Planning","award":["NRF-2017R1A1A1A05001325"],"award-info":[{"award-number":["NRF-2017R1A1A1A05001325"]}]},{"name":"Brain Korea 21 Plus Project"},{"name":"Higher Education Commission of Pakistan"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2018,12]]},"DOI":"10.1109\/tie.2018.2815950","type":"journal-article","created":{"date-parts":[[2018,3,15]],"date-time":"2018-03-15T20:41:55Z","timestamp":1521146515000},"page":"9706-9716","source":"Crossref","is-referenced-by-count":47,"title":["Robust Antiwindup for One-Sided Lipschitz Systems Subject to Input Saturation and Applications"],"prefix":"10.1109","volume":"65","author":[{"given":"Muntazir","family":"Hussain","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9908-3971","authenticated-orcid":false,"given":"Muhammad","family":"Rehan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0993-9658","authenticated-orcid":false,"given":"Choon","family":"Ki Ahn","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Muhammad","family":"Tufail","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2016.1424"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2677327"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2015.09.056"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2046579"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2112781"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2054115"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2497201"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysconle.2012.05.005"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2017.2692745"},{"key":"ref34","doi-asserted-by":"crossref","first-page":"1","DOI":"10.1016\/j.automatica.2015.12.021","article-title":"Input-to-error stable observer for nonlinear sampled-data systems with application to one-sided Lipschitz systems","volume":"67","author":"hossein","year":"2016","journal-title":"Automatica"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2011.03.015"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2803261"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"1465","DOI":"10.1002\/rnc.1523","article-title":"Anti-windup synthesis for nonlinear dynamic inversion control schemes","volume":"20","author":"herrmann","year":"2010","journal-title":"Int J Robust Nonlinear"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysconle.2013.01.004"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCA.2009.2030164"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(98)00047-X"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0005-1098(00)00044-3"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.3182\/20100901-3-IT-2016.00069"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2010.5530715"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2011.0386"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2015.10.011"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2723860"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2015.12.078"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2740858"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s11071-013-0916-6"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JAS.2015.7296530"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733459"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICET.2016.7813237"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2008.10.003"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/S0959-1524(97)00011-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta:20070435"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TRA.2004.824933"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2007.906185"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2072270"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2016.2635678"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2016.01.010"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2742990"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2016.2586108"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2740849"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2740835"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8423765\/08316873.pdf?arnumber=8316873","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:23:15Z","timestamp":1642004595000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8316873\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,12]]},"references-count":40,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2815950","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,12]]}}}