{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T02:55:51Z","timestamp":1779332151533,"version":"3.51.4"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,1,1]],"date-time":"2019-01-01T00:00:00Z","timestamp":1546300800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"crossref","award":["2017YFB0902701"],"award-info":[{"award-number":["2017YFB0902701"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100010880","name":"State Grid Corporation of China","doi-asserted-by":"crossref","award":["52199916024K"],"award-info":[{"award-number":["52199916024K"]}],"id":[{"id":"10.13039\/501100010880","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100005311","name":"China Southern Power Grid","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100005311","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2019,1]]},"DOI":"10.1109\/tie.2018.2826455","type":"journal-article","created":{"date-parts":[[2018,4,12]],"date-time":"2018-04-12T20:25:22Z","timestamp":1523564722000},"page":"571-579","source":"Crossref","is-referenced-by-count":79,"title":["Transient Voltage Measurements for Overhead Transmission Lines and Substations by Metal-Free and Contactless Integrated Electro-Optic Field Sensors"],"prefix":"10.1109","volume":"66","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2390-4152","authenticated-orcid":false,"given":"Hai","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2579-050X","authenticated-orcid":false,"given":"Chijie","family":"Zhuang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4514-605X","authenticated-orcid":false,"given":"Rong","family":"Zeng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shijun","family":"Xie","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4458-5026","authenticated-orcid":false,"given":"Jinliang","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"2550","DOI":"10.1109\/TPWRD.2013.2267781","article-title":"Development of full frequency bandwidth measurement of VFTO in UHV GIS","volume":"28","author":"yue","year":"2013","journal-title":"IEEE Trans Power Del"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"415","DOI":"10.1049\/ip-c.1987.0068","article-title":"Measurement of surge current and voltage\n waveforms using optical-transmission techniques","volume":"134","author":"nojima","year":"1987","journal-title":"IEE Proc Gener Transm Distrib"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1049\/cp:19990531"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/61.193861"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2708037"},{"key":"ref15","first-page":"116","article-title":"Construction principle\n and application test of 220 kV self-healing optical voltage sensor","volume":"511?512","year":"2014","journal-title":"Adv Mater Res"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2015.11.037"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/61.489370"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2013.6451353"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICLP.2016.7791438"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2011.2143436"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.839183"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/19.552154"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SIPDA.2011.6088460"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2010.2042467"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.1136644"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2004.839214"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2278120"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"599","DOI":"10.3390\/en4040599","article-title":"A smart online over-voltage monitoring and\n identification system","volume":"4","author":"wang","year":"2011","journal-title":"Energies"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"11406","DOI":"10.3390\/s120811406","article-title":"Development and application of integrated\n optical sensors for intense E-field measurement","volume":"12","author":"zeng","year":"2012","journal-title":"SENSORS"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.3665633"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1088\/1674-1137\/37\/7\/077003"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/T-DEI.2008.4446764"},{"key":"ref23","first-page":"24","article-title":"Application of an integrated electro-optic\n sensor for measuring very fast overvoltages in GIS","author":"zeng","year":"0","journal-title":"Proc Int Symp High Voltage Engineering"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8453958\/08336880.pdf?arnumber=8336880","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:06:31Z","timestamp":1657746391000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8336880\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,1]]},"references-count":24,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2826455","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,1]]}}}