{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,15]],"date-time":"2026-04-15T18:31:05Z","timestamp":1776277865592,"version":"3.50.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,4,1]],"date-time":"2019-04-01T00:00:00Z","timestamp":1554076800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Shanghai Sailing Program","award":["18YF1408900"],"award-info":[{"award-number":["18YF1408900"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2019,4]]},"DOI":"10.1109\/tie.2018.2847647","type":"journal-article","created":{"date-parts":[[2018,6,21]],"date-time":"2018-06-21T18:54:20Z","timestamp":1529607260000},"page":"3185-3195","source":"Crossref","is-referenced-by-count":27,"title":["Compressed Sensing Method for IGBT High-Speed Switching Time On-Line Monitoring"],"prefix":"10.1109","volume":"66","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0824-6518","authenticated-orcid":false,"given":"Hao","family":"Li","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6151-8522","authenticated-orcid":false,"given":"Dawei","family":"Xiang","sequence":"additional","affiliation":[]},{"given":"Xingwu","family":"Yang","sequence":"additional","affiliation":[]},{"given":"Xinyu","family":"Zhang","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2014.7049178"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2003.820031"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2007.914731"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2360140"},{"key":"ref30","first-page":"182","article-title":"Comparison of junction temperature evaluations in a power IGBTs module using an IR camera and\n three thermo-sensitive electrical parameters","author":"avenas","year":"0","journal-title":"Proc 27th Annu IEEE Appl Power Electron Conf Expo"},{"key":"ref37","first-page":"1602","article-title":"A smart gate\n drive with self-diagnosis for power MOSFETs and IGBTs","author":"chen","year":"0","journal-title":"Proc IEEE Appl Power Electron Conf Expo"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2007.909108"},{"key":"ref35","first-page":"23","article-title":"Comparative analysis of wavelet basis\n functions for ECG signal compression through compressive sensing","volume":"3","author":"mishra","year":"2012","journal-title":"Int J Comput Sci Telecommun"},{"key":"ref34","author":"mallat","year":"2008","journal-title":"A Wavelet Tour of Signal Processing The Sparse Way"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2013.6678855"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2373390"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2745442"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2178433"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.918399"},{"key":"ref15","first-page":"1","article-title":"Evaluation of on-state voltage VCE(ON) and threshold voltage Vth for real-time\n health monitoring of IGBT power modules","author":"eleffendi","year":"0","journal-title":"Proc 17th Eur Conf Power Electron Appl"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2007.07.027"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2481465"},{"key":"ref18","article-title":"A switching characteristics based method for power converter IGBT failure prognosis","author":"xiang","year":"2016"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2125803"},{"key":"ref28","year":"0"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2168556"},{"key":"ref27","author":"amerasekera","year":"1997","journal-title":"Failure Mechanisms in Semiconductor Devices"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2309937"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2049377"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2160988"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2251358"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2196894"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2346485"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2124436"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2375853"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2181290"},{"key":"ref20","article-title":"Method and apparatus for power electronics health monitoring","author":"ryan","year":"2002"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2159848"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2210249"},{"key":"ref24","first-page":"1","article-title":"On-line junction temperature measurement of IGBTs based on temperature sensitive electrical\n parameters","author":"kuhn","year":"0","journal-title":"Proc 13th Eur Conf Power Electron Appl"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2020134"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.crma.2008.03.014"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.871582"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8556518\/08392509.pdf?arnumber=8392509","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:49:23Z","timestamp":1657745363000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8392509\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,4]]},"references-count":38,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2847647","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,4]]}}}