{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T12:39:43Z","timestamp":1780317583309,"version":"3.54.1"},"reference-count":34,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100004361","name":"Texas Instruments","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004361","id-type":"DOI","asserted-by":"publisher"}]},{"name":"SRC/TxACE Center","award":["2810.016"],"award-info":[{"award-number":["2810.016"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/tie.2018.2879281","type":"journal-article","created":{"date-parts":[[2018,11,7]],"date-time":"2018-11-07T19:30:06Z","timestamp":1541619006000},"page":"7260-7269","source":"Crossref","is-referenced-by-count":107,"title":["Severity Estimation of Interturn Short Circuit Fault for PMSM"],"prefix":"10.1109","volume":"66","author":[{"given":"Yuan","family":"Qi","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Emine","family":"Bostanci","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mohsen","family":"Zafarani","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6912-7219","authenticated-orcid":false,"given":"Bilal","family":"Akin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","first-page":"123","article-title":"Considerations regarding the influence of contact resistance on the contacts of low voltage electrical equipment","author":"andru?c?","year":"0","journal-title":"Proc Int Conf Expo Elect Power Eng"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2030211"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/DEMPED.2015.7303702"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2191253"},{"key":"ref34","first-page":"1","article-title":"About contact resistance of the electrical equipment","author":"gheorghi??","year":"0","journal-title":"Proc Int Conf Modern Power System"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011580"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2388493"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2265400"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2496900"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2222857"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2013.6647296"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2015.7309970"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2253081"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2004662"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2626264"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2002.1003411"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2499162"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2015.0443"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2050496"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2006.892301"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2632068"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2005.847964"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2007529"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2007.900446"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2018.2811538"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2318207"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417511"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2016.7854673"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2809668"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2688973"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2360813"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2222049"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2198077"},{"key":"ref25","doi-asserted-by":"crossref","first-page":"4210","DOI":"10.1109\/TIE.2008.2005019","article-title":"Analytical prediction of the short-circuit current in fault-tolerant permanent-magnet machines","volume":"55","author":"sun","year":"2008","journal-title":"IEEE Trans Ind Electron"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8703752\/08526521.pdf?arnumber=8526521","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:06:42Z","timestamp":1657746402000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8526521\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":34,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2879281","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,9]]}}}