{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,14]],"date-time":"2026-03-14T18:04:02Z","timestamp":1773511442136,"version":"3.50.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,9,1]],"date-time":"2019-09-01T00:00:00Z","timestamp":1567296000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Fundao para a Cincia e a Tecnologia","award":["NORTE-01-0145-FEDER-022090"],"award-info":[{"award-number":["NORTE-01-0145-FEDER-022090"]}]},{"name":"Fundao para a Cincia e a Tecnologia","award":["PD\/BD\/128208\/2016"],"award-info":[{"award-number":["PD\/BD\/128208\/2016"]}]},{"name":"Fundao para a Cincia e a Tecnologia","award":["PTDC\/EEI-EEE\/31416\/2017"],"award-info":[{"award-number":["PTDC\/EEI-EEE\/31416\/2017"]}]},{"name":"Fundao para a Cincia e a Tecnologia","award":["PTDC\/EMD-TLM\/31200\/2017"],"award-info":[{"award-number":["PTDC\/EMD-TLM\/31200\/2017"]}]},{"name":"Fundao para a Cincia e a Tecnologia","award":["SFRH\/BD\/111538\/2015"],"award-info":[{"award-number":["SFRH\/BD\/111538\/2015"]}]},{"name":"Fundao para a Cincia e a Tecnologia","award":["SFRH\/BPD\/116007\/2016"],"award-info":[{"award-number":["SFRH\/BPD\/116007\/2016"]}]},{"name":"Fundao para a Cincia e a Tecnologia","award":["UID\/CEC\/50021\/2013"],"award-info":[{"award-number":["UID\/CEC\/50021\/2013"]}]},{"name":"Fundao para a Cincia e a Tecnologia","award":["UID\/NAN\/50024\/2013"],"award-info":[{"award-number":["UID\/NAN\/50024\/2013"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2019,9]]},"DOI":"10.1109\/tie.2018.2879306","type":"journal-article","created":{"date-parts":[[2018,11,7]],"date-time":"2018-11-07T19:30:06Z","timestamp":1541619006000},"page":"7326-7337","source":"Crossref","is-referenced-by-count":51,"title":["High-Resolution Nondestructive Test Probes Based on Magnetoresistive Sensors"],"prefix":"10.1109","volume":"66","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3196-8677","authenticated-orcid":false,"given":"Diogo M.","family":"Caetano","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7525-1969","authenticated-orcid":false,"given":"Taimur","family":"Rabuske","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jorge","family":"Fernandes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Matthias","family":"Pelkner","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Claude","family":"Fermon","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6913-6529","authenticated-orcid":false,"given":"Susana","family":"Cardoso","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Belen","family":"Ribes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7339-5275","authenticated-orcid":false,"given":"Fernando","family":"Franco","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Johannes","family":"Paul","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Moises","family":"Piedade","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0015-1186","authenticated-orcid":false,"given":"Paulo P.","family":"Freitas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.3139284"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1142\/S2010324711000070"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4863933"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1063\/1.364744"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1063\/1.2173636"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2008.2002604"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052869"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.811979"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2010.5488183"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.3390\/s120912169"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1063\/1.1711651"},{"key":"ref6","first-page":"406","article-title":"Magnetoresistive sensors for nondestructive evaluation","author":"jander","year":"0","journal-title":"Proc Soc Photo-Opt Instrum Eng"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.2902675"},{"key":"ref8","article-title":"A CMOS ASIC for precise reading of a magnetoresistive sensor array for NDT","author":"caetano","year":"0","journal-title":"Proc Eur Conf Non-Destructive Testing"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2636807"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.3390\/s110302525"},{"key":"ref1","first-page":"41","article-title":"Overview of nondestructive testing","volume":"166","year":"2008","journal-title":"American Magazine"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2326959"},{"key":"ref20","article-title":"Eddy current probes based on magnetoresistive array sensors as receivers","author":"sergeeva-chollet","year":"0","journal-title":"Proc 14th World Conf Non Destructive Testing"},{"key":"ref22","article-title":"MR-based eddy current probe design for hidden defects detection","author":"pelkner","year":"0","journal-title":"Proc Eur Conf Non-Destructive Testing"},{"key":"ref21","article-title":"Eddy current testing with high-spatial resolution probes using MR arrays as receiver","author":"pelkner","year":"0","journal-title":"Proc Int Symp NDT Aerosp"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2014.03.021"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8703752\/08526523.pdf?arnumber=8526523","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:06:43Z","timestamp":1657746403000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8526523\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,9]]},"references-count":23,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2879306","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,9]]}}}