{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,28]],"date-time":"2026-03-28T00:00:07Z","timestamp":1774656007546,"version":"3.50.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,10,1]],"date-time":"2019-10-01T00:00:00Z","timestamp":1569888000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100007053","name":"Korea Institute of Energy Technology Evaluation and Planning","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100007053","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Industry, and Energy, Republic of Korea","award":["20154030200610"],"award-info":[{"award-number":["20154030200610"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2019,10]]},"DOI":"10.1109\/tie.2018.2880670","type":"journal-article","created":{"date-parts":[[2018,11,20]],"date-time":"2018-11-20T19:47:55Z","timestamp":1542743275000},"page":"7561-7570","source":"Crossref","is-referenced-by-count":80,"title":["Stray Flux Monitoring for Reliable Detection of Rotor Faults Under the Influence of Rotor Axial Air Ducts"],"prefix":"10.1109","volume":"66","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5006-0234","authenticated-orcid":false,"given":"Yonghyun","family":"Park","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chanseung","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9662-5755","authenticated-orcid":false,"given":"Jongwan","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1203-2600","authenticated-orcid":false,"given":"Heonyoung","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0736-5040","authenticated-orcid":false,"given":"Sang Bin","family":"Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9730-4267","authenticated-orcid":false,"given":"Konstantinos N.","family":"Gyftakis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5889-4412","authenticated-orcid":false,"given":"Panagiotis A.","family":"Panagiotou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6710-8196","authenticated-orcid":false,"given":"Shahin Hedayati","family":"Kia","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6589-7686","authenticated-orcid":false,"given":"Gerard-Andre","family":"Capolino","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2002.800591"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2259132"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2297448"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2331027"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/ip-b.1986.0019"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2163285"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2361115"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2005.195805"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2004.836170"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.816531"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2619318"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/60.4749"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2603968"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/2943.930988"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2637169"},{"key":"ref8","article-title":"Induction motor case histories: A focus on electrically related phenomena","author":"evans","year":"0","journal-title":"Proceedings of the 21st Annual Meeting of the Vibration Institute"},{"key":"ref7","first-page":"1236","article-title":"On-line current monitoring &#x2013; The influence of mechanical loads or a unique rotor design on the diagnosis of broken rotor bars in induction motors","author":"thomson","year":"0","journal-title":"Proc Int Conf Elect Mach"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2375853"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2464301"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2007527"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2006.347365"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2611585"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/28.120226"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096633"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2745408"},{"key":"ref26","article-title":"Squirrel cage rotor testing","author":"bishop","year":"2003","journal-title":"EASA Conven"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096576"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8728044\/08541132.pdf?arnumber=8541132","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:55:48Z","timestamp":1657745748000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8541132\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,10]]},"references-count":27,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2880670","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,10]]}}}