{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T09:59:08Z","timestamp":1740131948517,"version":"3.37.3"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Spanish MINECO","award":["ESP2016-79612-C3-2R"],"award-info":[{"award-number":["ESP2016-79612-C3-2R"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/tie.2018.2890488","type":"journal-article","created":{"date-parts":[[2019,1,24]],"date-time":"2019-01-24T02:57:13Z","timestamp":1548298633000},"page":"8628-8637","source":"Crossref","is-referenced-by-count":3,"title":["Diffusive Representation and Sliding Mode Control of Charge Trapping in Al$_2$O$_3$ MOS Capacitors"],"prefix":"10.1109","volume":"66","author":[{"given":"Chenna Reddy","family":"Bheesayagari","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0356-5678","authenticated-orcid":false,"given":"Joan","family":"Pons-Nin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3105-352X","authenticated-orcid":false,"given":"Maria Teresa","family":"Atienza","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5439-7953","authenticated-orcid":false,"given":"Manuel","family":"Dominguez-Pumar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Ionizing Radiation Effects in MOS Devices and Circuits","year":"1989","author":"ma","key":"ref38"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2018.2834515"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.oceaneng.2017.09.062"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2815942"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2018.02.011"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-17257-6"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2017.06.096"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2605621"},{"key":"ref34","first-page":"4817","article-title":"Diffusive representation of pseudo-differential time-operation","volume":"5","author":"montseny","year":"0","journal-title":"Proc ESAIM"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.08.001"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2011.2105241"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2197000"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/S0301-0104(99)00349-3"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2028231"},{"key":"ref15","first-page":"1","article-title":"Analytic thermal modeling of power electronic components: The diffusive representation","author":"m\u2019rad","year":"0","journal-title":"Proc 4th Int Conf Integr Power Syst"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.834501"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2480383"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2645159"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2509914"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.06.084"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2005.02.001"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2748033"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2004.836727"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.09.002"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2017.09.044"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2009.03.120"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2543239"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2238237"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.1570933"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2017.05.015"},{"journal-title":"Fundamentals of Solid State Engineering","year":"2006","author":"razeghi","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2612619"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2259260"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351592"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2005.860667"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.2001040"},{"journal-title":"Radiation Effects in Advanced Semiconductor Materials and Devices","year":"2013","author":"claeys","key":"ref26"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.812928"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8752485\/08605514.pdf?arnumber=8605514","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:51:55Z","timestamp":1657745515000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8605514\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":38,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2018.2890488","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2019,11]]}}}