{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,10]],"date-time":"2026-07-10T16:28:11Z","timestamp":1783700891538,"version":"3.55.0"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Defense Industrial Technology Development Program of China","award":["JCKY2017212C005"],"award-info":[{"award-number":["JCKY2017212C005"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61703121"],"award-info":[{"award-number":["61703121"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2017M611368"],"award-info":[{"award-number":["2017M611368"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2018T110299"],"award-info":[{"award-number":["2018T110299"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,1]]},"DOI":"10.1109\/tie.2019.2892705","type":"journal-article","created":{"date-parts":[[2019,1,31]],"date-time":"2019-01-31T20:20:10Z","timestamp":1548966010000},"page":"521-530","source":"Crossref","is-referenced-by-count":92,"title":["A Data-Driven Realization of the Control-Performance-Oriented Process Monitoring System"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2143-2438","authenticated-orcid":false,"given":"Hao","family":"Luo","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3802-9269","authenticated-orcid":false,"given":"Shen","family":"Yin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8117-1201","authenticated-orcid":false,"given":"Tianyu","family":"Liu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4153-0548","authenticated-orcid":false,"given":"Abdul Qayyum","family":"Khan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref33","author":"vinnicombe","year":"2001","journal-title":"Uncertainty and Feedback Loop-Shaping and the -gap Metric"},{"key":"ref32","author":"sj\u00f6","year":"1992","journal-title":"Updating Techniques in Recursive Least-Squares Estimation"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0409-4"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4613-0465-4"},{"key":"ref37","author":"zhou","year":"1996","journal-title":"Robust and Optimal Control"},{"key":"ref36","author":"zhou","year":"1998","journal-title":"Essentials of Robust Control"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2512221"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2009.07.005"},{"key":"ref11","article-title":"Data driven fault tolerant control: A subspace approach","author":"dong","year":"2009"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1137\/S089547989223691X"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/BF02145580"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.1998.757796"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/S0005-1098(00)00023-6"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/9.29424"},{"key":"ref17","author":"golub","year":"2012","journal-title":"Matrix Computations"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1201\/b15752"},{"key":"ref19","author":"huang","year":"2008","journal-title":"Dynamic Modeling Predictive Control and Performance Monitoring A Data-driven Subspace Approach"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2016.2636337"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1137\/S089547989222895X"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2577623"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-94-007-2300-9"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jfranklin.2016.10.031"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/SMC.2018.00531"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/0167-6911(90)90057-2"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-6410-4"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2003.10.002"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/1099-1239(200009\/10)10:11\/12<909::AID-RNC532>3.0.CO;2-Z"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2014.08.022"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2327555"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/S0167-6911(96)00065-5"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/1-84628-158-X"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2015.08.061"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2519325"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/aic.11576"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2014.6864996"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2013.11.012"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8822830\/08630671.pdf?arnumber=8630671","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:50:57Z","timestamp":1651067457000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8630671\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,1]]},"references-count":37,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2892705","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,1]]}}}