{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,16]],"date-time":"2026-04-16T16:29:31Z","timestamp":1776356971547,"version":"3.51.2"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51720105004"],"award-info":[{"award-number":["51720105004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,1]]},"DOI":"10.1109\/tie.2019.2893837","type":"journal-article","created":{"date-parts":[[2019,1,24]],"date-time":"2019-01-24T00:26:45Z","timestamp":1548289605000},"page":"551-559","source":"Crossref","is-referenced-by-count":49,"title":["Piezoelectric\u2013Piezoresistive Coupling MEMS Sensors for Measurement of Electric Fields of Broad Bandwidth and Large Dynamic Range"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-5122-0244","authenticated-orcid":false,"given":"Fen","family":"Xue","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jun","family":"Hu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yue","family":"Guo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Guowei","family":"Han","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong","family":"Ouyang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shan X.","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4458-5026","authenticated-orcid":false,"given":"Jinliang","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/SOLSEN.1990.109823"},{"key":"ref31","first-page":"115","article-title":"Silicon micromachined pressure sensors","volume":"87","author":"bhat","year":"2007","journal-title":"J Indian Inst Sci"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1557\/JMR.1997.0010"},{"key":"ref10","doi-asserted-by":"crossref","first-page":"11406","DOI":"10.3390\/s120811406","article-title":"Development and application of integrated optical sensors for intense E-field measurement","volume":"12","author":"zeng","year":"2012","journal-title":"SENSORS"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2700998"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2250315"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.physb.2006.02.018"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.3390\/s16010055"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1116\/1.587914"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2014.2387829"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0924-4247(97)01545-8"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.94.42"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCPCT.2014.7055011"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1063\/1.1931164"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2011.2120634"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1982.20659"},{"key":"ref3","doi-asserted-by":"crossref","first-page":"380","DOI":"10.1109\/TEMC.2004.831842","article-title":"Susceptibility of some electronic equipment to HPEM threats","volume":"46","author":"daniel","year":"2004","journal-title":"IEEE Trans Electromagn Comput"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.proeng.2010.09.397"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/S0040-6090(96)08972-9"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.17775\/CSEEJPES.2015.00032"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/16\/5\/006"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/s41928-017-0009-5"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1038\/499145a"},{"key":"ref9","article-title":"MEMS electric field sensor for smart grid","year":"2014"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2010.49"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1038\/nature22068"},{"key":"ref22","article-title":"Recent advances in processing, structural and dielectric properties of PMN-PT ferroelectric ceramics at compositions around the MPB","author":"ara\u00fajo","year":"2011","journal-title":"Advances in Ceramics-Electric and Magnetic Ceramics Bioceramics Ceramics and Environment"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1080\/07315179008201118"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.119.017601"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.116.027601"},{"key":"ref26","year":"2003","journal-title":"Practice for Conversion Between Resistivity and Dopant Density for Boron-Doped Phosphorus-Doped and Arsenic-Doped Silicon"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1111\/j.1151-2916.2003.tb03628.x"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8822830\/08624578.pdf?arnumber=8624578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:50:58Z","timestamp":1651067458000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,1]]},"references-count":32,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2893837","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,1]]}}}