{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,14]],"date-time":"2026-01-14T14:58:33Z","timestamp":1768402713669,"version":"3.49.0"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,1]]},"DOI":"10.1109\/tie.2019.2893856","type":"journal-article","created":{"date-parts":[[2019,1,24]],"date-time":"2019-01-24T00:26:45Z","timestamp":1548289605000},"page":"28-37","source":"Crossref","is-referenced-by-count":42,"title":["Improved Direct Torque Control for a DFIG under Symmetrical Voltage Dip With Transient Flux Damping"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7537-5497","authenticated-orcid":false,"given":"M. R.","family":"Agha Kashkooli","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8307-3819","authenticated-orcid":false,"given":"Seyed M.","family":"Madani","sequence":"additional","affiliation":[]},{"given":"Thomas A.","family":"Lipo","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2226417"},{"key":"ref32","author":"ogata","year":"2010","journal-title":"Modern Control Engineering"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2519327"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2016.0695"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2382603"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2205354"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2429153"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2014.2385966"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2645791"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ChiCC.2016.7554753"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2016.0372"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2689773"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2443916"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2011.2113381"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2750738"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1002\/9781118104965"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2011.2174387"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2622564"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2010.2048033"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2243372"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2004.831717"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2161776"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2253439"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2160397"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2103910"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2370938"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.921160"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2010.2042650"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2009.0021"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2014.0252"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2418791"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2012.2189214"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2011.2163718"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8822830\/08624605.pdf?arnumber=8624605","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:50:59Z","timestamp":1651067459000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8624605\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,1]]},"references-count":33,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2893856","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,1]]}}}