{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,30]],"date-time":"2026-05-30T01:26:35Z","timestamp":1780104395662,"version":"3.54.0"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T00:00:00Z","timestamp":1577836800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100010218","name":"Department of Science and Technology","doi-asserted-by":"publisher","award":["SP\/YO\/054\/2016"],"award-info":[{"award-number":["SP\/YO\/054\/2016"]}],"id":[{"id":"10.13039\/501100010218","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,1]]},"DOI":"10.1109\/tie.2019.2897506","type":"journal-article","created":{"date-parts":[[2019,2,11]],"date-time":"2019-02-11T19:28:13Z","timestamp":1549913293000},"page":"350-357","source":"Crossref","is-referenced-by-count":75,"title":["Modeling and State-of-Charge Estimation of Supercapacitor Considering Leakage Effect"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2894-7258","authenticated-orcid":false,"given":"Pankaj","family":"Saha","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8069-0181","authenticated-orcid":false,"given":"Satadru","family":"Dey","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4700-2508","authenticated-orcid":false,"given":"Munmun","family":"Khanra","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","article-title":"Datasheet BCAP0005 Ultracapacitor","year":"2018"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.3182\/20050703-6-CZ-1902.01821"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2655578"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1149\/2.0081505jes"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2016.01.066"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2013.01.173"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.02.001"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2005.10.004"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ICCA.2013.6564962"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2017.8052901"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2259780"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/S0008-6223(00)00183-4"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.03.122"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2010.11.152"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2017.03.001"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCA.2013.6564963"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2017.03.060"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.07.050"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ChiCC.2014.6896626"},{"key":"ref18","first-page":"1","article-title":"Design of EKF-based SOC estimator for an ultracapacitor module","author":"pavkov?","year":"0","journal-title":"Proc IEEE Int Conf Comput Tool"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN.2015.7281922"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2011.06.042"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2161096"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2014.09.061"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.921078"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2494868"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2017.01.044"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1021\/jz4002967"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/28.821816"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/7.869502"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7753(00)00485-7"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.2007116"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TWC.2013.052213.121561"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2017.2781650"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2010.10.075"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ITEC-AP.2017.8080946"},{"key":"ref42","article-title":"Datasheet MICAz wireless measurement system","year":"2018"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/1555816.1555849"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ACC.2012.6314697"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2387113"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2004.03.068"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2014.2314333"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8822830\/08638851.pdf?arnumber=8638851","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:51:08Z","timestamp":1651067468000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8638851\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,1]]},"references-count":42,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2897506","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,1]]}}}