{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,31]],"date-time":"2026-03-31T13:42:28Z","timestamp":1774964548926,"version":"3.50.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61825302"],"award-info":[{"award-number":["61825302"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61751210"],"award-info":[{"award-number":["61751210"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Jiangsu Natural Science Foundation of China","award":["BK20171417"],"award-info":[{"award-number":["BK20171417"]}]},{"DOI":"10.13039\/501100012154","name":"Funding of Jiangsu Innovation Program for Graduate Education","doi-asserted-by":"crossref","award":["KYCX18_0298"],"award-info":[{"award-number":["KYCX18_0298"]}],"id":[{"id":"10.13039\/501100012154","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,2]]},"DOI":"10.1109\/tie.2019.2898575","type":"journal-article","created":{"date-parts":[[2019,2,15]],"date-time":"2019-02-15T19:43:02Z","timestamp":1550259782000},"page":"1261-1269","source":"Crossref","is-referenced-by-count":52,"title":["Anti-Disturbance Control for Nonlinear Systems Based on Interval Observer"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9464-9297","authenticated-orcid":false,"given":"Kenan","family":"Yong","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7158-8575","authenticated-orcid":false,"given":"Mou","family":"Chen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9271-4988","authenticated-orcid":false,"given":"Qingxian","family":"Wu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838065"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2017.2700433"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2013.2248733"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/41.969383"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2711575"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.robot.2017.08.008"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2013.05.003"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/41.681230"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/70.285586"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2013.2246894"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2774734"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2017.2720419"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2014.2298034"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2622219"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TAES.2013.6494412"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2450714"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2009.2037472"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2014.2359714"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/S0304-3800(00)00279-9"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2011.09.045"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/41.836359"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2013.2294618"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2004.839034"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011621"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2803773"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2017.2681520"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2694410"},{"key":"ref7","doi-asserted-by":"crossref","first-page":"1905","DOI":"10.1109\/TAC.2010.2049522","article-title":"Disturbance observer for estimating higher order disturbances in time series expansion","volume":"55","author":"kim","year":"2010","journal-title":"IEEE Trans Autom Control"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/PBCE084E"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cta.2015.1160"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2478397"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2010.10.019"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2399401"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2011.2164820"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2017.2707462"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CONTROL.2016.7737619"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1090\/surv\/041"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2003.809820"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8855152\/08643056.pdf?arnumber=8643056","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:52:17Z","timestamp":1651067537000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8643056\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,2]]},"references-count":38,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2898575","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,2]]}}}