{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,13]],"date-time":"2026-04-13T07:10:53Z","timestamp":1776064253375,"version":"3.50.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,2,1]],"date-time":"2020-02-01T00:00:00Z","timestamp":1580515200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61873024"],"award-info":[{"award-number":["61873024"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61773053"],"award-info":[{"award-number":["61773053"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"Natural Science Foundation of China","doi-asserted-by":"crossref","award":["61673032"],"award-info":[{"award-number":["61673032"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"name":"Fundamental Research Funds for the China Central Universities"},{"name":"University of Science and Technology Beijing, China","award":["FRF-BD-18-002A"],"award-info":[{"award-number":["FRF-BD-18-002A"]}]},{"name":"University of Science and Technology Beijing, China","award":["FRF-GF-17-A4"],"award-info":[{"award-number":["FRF-GF-17-A4"]}]},{"name":"National Key R&D Program of China","award":["2017YFB0306403"],"award-info":[{"award-number":["2017YFB0306403"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,2]]},"DOI":"10.1109\/tie.2019.2898576","type":"journal-article","created":{"date-parts":[[2019,2,21]],"date-time":"2019-02-21T19:48:30Z","timestamp":1550778510000},"page":"1316-1327","source":"Crossref","is-referenced-by-count":45,"title":["A Novel Hierarchical Detection and Isolation Framework for Quality-Related Multiple Faults in Large-Scale Processes"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1292-5310","authenticated-orcid":false,"given":"Liang","family":"Ma","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jie","family":"Dong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8314-3047","authenticated-orcid":false,"given":"Kaixiang","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/83.661182"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.2307\/1269551"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1021\/ie070381q"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1126\/science.1205438"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2014.2315526"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/18.382009"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1561\/2200000016"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2017.2693221"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2010.03.003"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2875067"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.5b03902"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2018.02.002"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2009.2033181"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2303781"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2016.08.006"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.08.010"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(00)00062-9"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.02.027"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2010.07.007"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2752709"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2015.02.004"},{"key":"ref27","first-page":"682","article-title":"Using the Nyström method to speed up kernel machines","author":"williams","year":"2001","journal-title":"Neural Inf Process Syst"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2866403"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2015.2464331"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSVT.2018.2799214"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2014.2384371"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2633989"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2782232"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2308133"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733501"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mfglet.2014.12.001"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2003.10.002"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TSMCB.2009.2024759"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1111\/j.1467-9868.2011.00783.x"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ifacol.2015.09.034"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1198\/TECH.2011.08118"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2009.2032654"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0347-9"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8855152\/08648380.pdf?arnumber=8648380","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:51:53Z","timestamp":1651067513000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8648380\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,2]]},"references-count":38,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2898576","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,2]]}}}