{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,14]],"date-time":"2026-02-14T09:33:02Z","timestamp":1771061582337,"version":"3.50.1"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,3,1]],"date-time":"2020-03-01T00:00:00Z","timestamp":1583020800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Programme of China","award":["2017YFA0207201"],"award-info":[{"award-number":["2017YFA0207201"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61573121"],"award-info":[{"award-number":["61573121"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012237","name":"Beijing Advanced Innovation Center for Intelligent Robots and Systems","doi-asserted-by":"crossref","award":["2018IRS02"],"award-info":[{"award-number":["2018IRS02"]}],"id":[{"id":"10.13039\/501100012237","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,3]]},"DOI":"10.1109\/tie.2019.2902792","type":"journal-article","created":{"date-parts":[[2019,3,18]],"date-time":"2019-03-18T23:31:42Z","timestamp":1552951902000},"page":"2430-2439","source":"Crossref","is-referenced-by-count":52,"title":["High-Speed AFM Imaging of Nanopositioning Stages Using H$_{\\infty }$ and Iterative Learning Control"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4299-2776","authenticated-orcid":false,"given":"Hui","family":"Xie","sequence":"first","affiliation":[]},{"given":"Yongbing","family":"Wen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9676-4835","authenticated-orcid":false,"given":"Xingjian","family":"Shen","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1896-9859","authenticated-orcid":false,"given":"Hao","family":"Zhang","sequence":"additional","affiliation":[]},{"given":"Lining","family":"Sun","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","author":"postlethwaite","year":"1996","journal-title":"Multivariable Feedback Control Analysis and Design"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1115\/1.3143822"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2013.2295112"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2013.2270560"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2012.08.001"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2007.899722"},{"key":"ref37","doi-asserted-by":"crossref","first-page":"12","DOI":"10.1016\/j.conengprac.2016.02.007","article-title":"High speed laser scanning microscopy by iterative learning control of a galvanometer scanner","volume":"50","author":"han","year":"2016","journal-title":"Control Eng Pract"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1063\/1.1499533"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2157287"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1177\/095965180421800607"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2011.2105499"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2015.2394327"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2010.2040282"},{"key":"ref13","first-page":"44030-1","article-title":"Breaking the speed limit with atomic force microscopy","volume":"18","author":"picco","year":"2006","journal-title":"Nanotechnol"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2009.03.021"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/21\/36\/365503"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/20\/36\/365503"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1063\/1.4725525"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNB.2007.909014"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1063\/1.1850651"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2005.844708"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"1002","DOI":"10.1126\/science.1067410","article-title":"Scanning probe evolution in biology","volume":"302","author":"horber","year":"2003","journal-title":"Sci"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2677300"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1002\/adma.200500701"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/S0006-3495(99)77275-9"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2010.2052366"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/el:19980865"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2006.01.011"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.127051"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/0927-7757(94)02954-Q"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1038\/nprot.2012.047"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.56.930"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2016.2538319"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2016.89"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1002\/asjc.1728"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MCS.2008.930922"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2008.04.061"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1115\/1.1341197"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2006.01.015"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8889771\/08664459.pdf?arnumber=8664459","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:54:43Z","timestamp":1651067683000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8664459\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,3]]},"references-count":39,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2902792","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,3]]}}}