{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T14:13:52Z","timestamp":1775744032189,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004543","name":"China Scholarship Council","doi-asserted-by":"publisher","award":["201606160048"],"award-info":[{"award-number":["201606160048"]}],"id":[{"id":"10.13039\/501100004543","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61703374"],"award-info":[{"award-number":["61703374"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"George W. Woodruff Faculty Fellowship"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/tie.2019.2912763","type":"journal-article","created":{"date-parts":[[2019,5,1]],"date-time":"2019-05-01T20:02:02Z","timestamp":1556740922000},"page":"3216-3225","source":"Crossref","is-referenced-by-count":198,"title":["Data-Driven Fault Diagnosis Method Based on Compressed Sensing and Improved Multiscale Network"],"prefix":"10.1109","volume":"67","author":[{"given":"Zhong-Xu","family":"Hu","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9324-4191","authenticated-orcid":false,"given":"Yan","family":"Wang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6828-0147","authenticated-orcid":false,"given":"Ming-Feng","family":"Ge","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0750-1030","authenticated-orcid":false,"given":"Jie","family":"Liu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2018.05.021"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2327589"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2762623"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2327555"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2018.03.025"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2017.2728371"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/s10489-017-1092-z"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2006.871582"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2005.862083"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICMSC.2017.7959483"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.08.002"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2759418"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.07.027"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298594"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2767540"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2018.06.042"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.06.024"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.02.007"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.11.014"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2015.10.025"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.06.012"},{"key":"ref8","article-title":"An adaptive deep convolutional neural network for rolling bearing fault diagnosis","volume":"28","author":"wang","year":"2017","journal-title":"Meas Sci Technol"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2607179"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2016.08.022"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6501\/aaaca6"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2013.11.012"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.308"},{"key":"ref22","author":"loparo","year":"0","journal-title":"Case Western Reserve University Bearing Data Center"},{"key":"ref21","author":"szegedy","year":"2017","journal-title":"Inception-v4 inception-resnet and the impact of residual connections on learning"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/26\/11\/115002"},{"key":"ref23","first-page":"20","author":"lecun","year":"2015","journal-title":"Lenet-5 convolutional neural networks"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2877090"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511801389"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/41\/8931048\/8704327-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8931048\/08704327.pdf?arnumber=8704327","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:52:18Z","timestamp":1651067538000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8704327\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":33,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2912763","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,4]]}}}