{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,10]],"date-time":"2026-02-10T21:17:40Z","timestamp":1770758260333,"version":"3.50.0"},"reference-count":56,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,5,1]],"date-time":"2020-05-01T00:00:00Z","timestamp":1588291200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51377175"],"award-info":[{"award-number":["51377175"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,5]]},"DOI":"10.1109\/tie.2019.2917368","type":"journal-article","created":{"date-parts":[[2019,6,4]],"date-time":"2019-06-04T19:48:35Z","timestamp":1559677715000},"page":"4108-4119","source":"Crossref","is-referenced-by-count":39,"title":["Experimental Evaluation of Transformer Internal Fault Detection Based on <i>V<\/i>\u2013<i>I<\/i> Characteristics"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8560-3403","authenticated-orcid":false,"given":"Xiaozhen","family":"Zhao","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1781-2756","authenticated-orcid":false,"given":"Chenguo","family":"Yao","sequence":"additional","affiliation":[]},{"given":"Zehong","family":"Zhou","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2490-5539","authenticated-orcid":false,"given":"Chengxiang","family":"Li","sequence":"additional","affiliation":[]},{"given":"Xianmin","family":"Wang","sequence":"additional","affiliation":[]},{"given":"Tianyu","family":"Zhu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2094-3036","authenticated-orcid":false,"given":"Ahmed","family":"Abu-Siada","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2479582"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AMM.672-674.1159"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2004.09.010"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/PECon.2012.6450356"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2011.2151285"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1049\/iet-smt.2017.0412"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1049\/iet-gtd.2010.0802"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2524399"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2015.0309"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2376033"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/en9050347"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2006.1657975"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.02.009"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301740"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2295770"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.03.044"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CMD.2012.6416174"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2017.10.014"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2010.5383923"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/PSCE.2009.4840111"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2440448"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2807414"},{"key":"ref50","article-title":"High frequency","author":"bjerkan","year":"2005"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.3390\/en11092434"},{"key":"ref56","author":"ertugrul","year":"2002","journal-title":"LabVIEW for Electric Circuits Machines Drives and Laboratories"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2626779"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2016.2594773"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1006\/gmip.1999.0500"},{"key":"ref52","author":"haralick","year":"1992","journal-title":"Computer and Robot Vision"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2014.6749571"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2009.2022674"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2015.2415554"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.004745"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.004977"},{"key":"ref14","year":"0","journal-title":"Power Transformers"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2006.258206"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2014.01.003"},{"key":"ref17","first-page":"1","year":"2013","journal-title":"IEEE Guide for the application and interpretation of frequency response analysis for oil-immersed transformers"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005060"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2015.7281530"},{"key":"ref4","year":"2015","journal-title":"Transformer Reliability Survey"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2157291"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPAS.1978.354718"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2017.8014387"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2282605"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2752135"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005518"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2016.005551"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/MEI.2003.1192032"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2418344"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2014.004283"},{"key":"ref47","article-title":"Mechanical-condition assessment of transformer windings using frequency response analysis (FRA)","volume":"2","author":"picher","year":"2008"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2012.6396941"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2723498"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2014.2358072"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2011.2180932"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8982108\/08730484.pdf?arnumber=8730484","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:54:36Z","timestamp":1651067676000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8730484\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,5]]},"references-count":56,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2917368","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,5]]}}}