{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T17:03:54Z","timestamp":1779383034978,"version":"3.53.1"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,6,1]],"date-time":"2020-06-01T00:00:00Z","timestamp":1590969600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51577025"],"award-info":[{"award-number":["51577025"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,6]]},"DOI":"10.1109\/tie.2019.2928248","type":"journal-article","created":{"date-parts":[[2019,7,17]],"date-time":"2019-07-17T20:01:03Z","timestamp":1563393663000},"page":"5071-5080","source":"Crossref","is-referenced-by-count":91,"title":["Fault Diagnosis and Monitoring of Modular Multilevel Converter With Fast Response of Voltage Sensors"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8474-2711","authenticated-orcid":false,"given":"Jianzhong","family":"Zhang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4625-9520","authenticated-orcid":false,"given":"Xing","family":"Hu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9928-5437","authenticated-orcid":false,"given":"Shuai","family":"Xu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yaqian","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2919-4481","authenticated-orcid":false,"given":"Zhe","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2462717"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2348194"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2454534"},{"key":"ref13","first-page":"2166","article-title":"Extended state observer based fault detection and location method for modular multilevel converters","author":"hu","year":"2016","journal-title":"Proc Ann Conf IEEE Ind Electron Soc"},{"key":"ref14","first-page":"1","article-title":"Fault diagnosis of modular multilevel converters based on extended state observer","author":"hu","year":"2016","journal-title":"Proc IEEE Int Symp Power Electron Distrib Gener Syst"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.3390\/en8077140"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2477476"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2608940"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2679439"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2526684"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2309937"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2310127"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2412658"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2615048"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2124436"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2850360"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2327641"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2242093"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2143431"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2756849"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2359005"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2646402"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2862247"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2513426"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2512842"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/8998597\/08765593.pdf?arnumber=8765593","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:53:46Z","timestamp":1651067626000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8765593\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,6]]},"references-count":25,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2928248","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,6]]}}}