{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,10]],"date-time":"2026-04-10T04:56:59Z","timestamp":1775797019369,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,8,1]],"date-time":"2020-08-01T00:00:00Z","timestamp":1596240000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Advanced Optoelectronic Technology Center"},{"DOI":"10.13039\/501100007750","name":"National Cheng Kung University","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100007750","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100010449","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100010449","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology, Taiwan","doi-asserted-by":"publisher","award":["107-2221-E-006-188-MY3"],"award-info":[{"award-number":["107-2221-E-006-188-MY3"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology, Taiwan","doi-asserted-by":"publisher","award":["107-2622-E-006-027-CC2"],"award-info":[{"award-number":["107-2622-E-006-027-CC2"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]},{"name":"AU Optronics Corporation"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,8]]},"DOI":"10.1109\/tie.2019.2940000","type":"journal-article","created":{"date-parts":[[2019,9,17]],"date-time":"2019-09-17T19:49:11Z","timestamp":1568749751000},"page":"7015-7024","source":"Crossref","is-referenced-by-count":10,"title":["A Pre-Bootstrapping Method for Use in Gate Driver Circuits to Improve the Scan Pulse Delay of High-Resolution TFT-LCD Systems"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4948-8591","authenticated-orcid":false,"given":"Chih-Lung","family":"Lin","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6210-9499","authenticated-orcid":false,"given":"Ming-Yang","family":"Deng","sequence":"additional","affiliation":[]},{"given":"Wen-Ching","family":"Chiu","sequence":"additional","affiliation":[]},{"given":"Li-Wei","family":"Shih","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8169-5745","authenticated-orcid":false,"given":"Jui-Hung","family":"Chang","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4172-7567","authenticated-orcid":false,"given":"Yu-Sheng","family":"Lin","sequence":"additional","affiliation":[]},{"given":"Ching-En","family":"Lee","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2011.2162937"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2325612"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2014.2366782"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2554539"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1002\/sdtp.12571"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2018.2843180"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2004.1277838"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838057"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2015.2419656"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880718"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2012.2225406"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2669887"},{"key":"ref27","doi-asserted-by":"crossref","first-page":"35","DOI":"10.1889\/1.3500457","article-title":"A novel high reliable integrated gate driver with bi-scanning structure using a-Si TFT for large size FHD TFT-LCD TVs","author":"shin","year":"2010","journal-title":"Proc SID Symp Dig Tech Papers"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2015.2479457"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2874582"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2756583"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2777381"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/sdtp.11561"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2445319"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2334675"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"706","DOI":"10.1002\/sdtp.12361","article-title":"IGZO-TFT technology for large-screen 8 K display","author":"hara","year":"2018","journal-title":"Proc SID Symp Dig Tech Papers"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2207658"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1002\/sdtp.10107"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1002\/sdtp.11896"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2016.2638832"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2710180"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2718730"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2018.2856892"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JDT.2016.2561081"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9062398\/08842621.pdf?arnumber=8842621","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:51:21Z","timestamp":1651067481000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8842621\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,8]]},"references-count":29,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2940000","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,8]]}}}