{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,8]],"date-time":"2026-08-08T11:17:53Z","timestamp":1786187873502,"version":"3.56.0"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51677161"],"award-info":[{"award-number":["51677161"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003787","name":"Natural Science Foundation of Hebei Province","doi-asserted-by":"publisher","award":["E2019203563"],"award-info":[{"award-number":["E2019203563"]}],"id":[{"id":"10.13039\/501100003787","id-type":"DOI","asserted-by":"publisher"}]},{"name":"State Key Laboratory of Reliability and Intelligence of Electrical Equipment","award":["EERIKF2018002"],"award-info":[{"award-number":["EERIKF2018002"]}]},{"DOI":"10.13039\/501100010850","name":"Hebei University of Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100010850","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,9]]},"DOI":"10.1109\/tie.2019.2941143","type":"journal-article","created":{"date-parts":[[2019,9,18]],"date-time":"2019-09-18T19:52:31Z","timestamp":1568836351000},"page":"7941-7950","source":"Crossref","is-referenced-by-count":54,"title":["A Current-Based Approach for Short-Circuit Fault Diagnosis in Closed-Loop Current Source Inverter"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9375-448X","authenticated-orcid":false,"given":"Xiaoqiang","family":"Guo","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0071-4735","authenticated-orcid":false,"given":"Sen","family":"Sui","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Baocheng","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5560-0175","authenticated-orcid":false,"given":"Wenlin","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.6113\/JPE.2016.16.3.1087"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2535960"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2005244"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2024779"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/DEMPED.2011.6063654"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2168800"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2011.5984487"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2098355"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2008.0075"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ICIT.2006.372201"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DEMPED.2011.6063649"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2364154"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/EPE.2005.219426"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2279383"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"1770","DOI":"10.1109\/TIA.2009.2027535","article-title":"A literature review of IGBT fault diagnostic and protection methods for power inverters","volume":"45","author":"lu","year":"2009","journal-title":"IEEE Trans Ind Appl"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2454534"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2015.7409178"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/cp.2014.0329"},{"key":"ref17","first-page":"1","article-title":"Sub-module fault analysis and fault-tolerant control strategy for modular multilevel converter","author":"lu","year":"2016","journal-title":"Proc 12th IET Int Conf AC DC Power Transm"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2304561"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/WEMDCD.2017.7947761"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2301167"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.24295\/CPSSTPEA.2017.00011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2188877"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2124436"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2422131"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2003.1211315"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2003.1280259"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301712"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2114313"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2798505"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2693340"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2913164"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2019.8721910"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.1999.769220"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/PEAC.2018.8590418"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/ITEC.2018.8450157"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2005.847961"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ITEC.2018.8450127"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2207655"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2018.8558419"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2023640"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2018.8341384"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/iet-epa.2013.0015"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9090028\/08844294.pdf?arnumber=8844294","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:54:35Z","timestamp":1651067675000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8844294\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9]]},"references-count":45,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2941143","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,9]]}}}