{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T09:40:27Z","timestamp":1775641227023,"version":"3.50.1"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,9,1]],"date-time":"2020-09-01T00:00:00Z","timestamp":1598918400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61703161"],"award-info":[{"award-number":["61703161"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61673173"],"award-info":[{"award-number":["61673173"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["222201714031"],"award-info":[{"award-number":["222201714031"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002858","name":"China Postdoctoral Science Foundation","doi-asserted-by":"publisher","award":["2017M611472"],"award-info":[{"award-number":["2017M611472"]}],"id":[{"id":"10.13039\/501100002858","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,9]]},"DOI":"10.1109\/tie.2019.2942560","type":"journal-article","created":{"date-parts":[[2019,9,25]],"date-time":"2019-09-25T19:56:07Z","timestamp":1569441367000},"page":"7994-8004","source":"Crossref","is-referenced-by-count":103,"title":["A Novel Dynamic Weight Principal Component Analysis Method and Hierarchical Monitoring Strategy for Process Fault Detection and Diagnosis"],"prefix":"10.1109","volume":"67","author":[{"given":"Yang","family":"Tao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9400-1415","authenticated-orcid":false,"given":"Hongbo","family":"Shi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1379-245X","authenticated-orcid":false,"given":"Bing","family":"Song","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9626-7831","authenticated-orcid":false,"given":"Shuai","family":"Tan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2016.2550426"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(94)00043-N"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.compchemeng.2006.09.004"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.2307\/2348005"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.cjche.2015.11.014"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2014.01.009"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1021\/ie3017016"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2012.09.002"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2700520"},{"key":"ref17","doi-asserted-by":"crossref","first-page":"2262","DOI":"10.1109\/TNN.2011.2165853","article-title":"Quality relevant data-driven modeling and monitoring of multivariate dynamic processes: the dynamic T-PLS approach","volume":"22","author":"li","year":"2011","journal-title":"IEEE Trans Neural Netw"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301761"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2853603"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2868316"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2016.11.007"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2018.07.038"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2012.09.004"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2013.2264723"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(94)88019-0"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2801804"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2018.07.012"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2764518"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1021\/ie302069q"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.06.009"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2864703"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2878405"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1002\/aic.690400509"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2417501"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2009.02.027"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9090028\/08848877.pdf?arnumber=8848877","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:54:34Z","timestamp":1651067674000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8848877\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,9]]},"references-count":31,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2942560","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,9]]}}}