{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,16]],"date-time":"2026-07-16T12:38:15Z","timestamp":1784205495916,"version":"3.55.0"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61971093"],"award-info":[{"award-number":["61971093"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61527803"],"award-info":[{"award-number":["61527803"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61960206010"],"award-info":[{"award-number":["61960206010"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Science and Technology Department of Sichuan, China","award":["2019YJ0208"],"award-info":[{"award-number":["2019YJ0208"]}]},{"name":"Science and Technology Department of Sichuan, China","award":["2018JY0655"],"award-info":[{"award-number":["2018JY0655"]}]},{"name":"Science and Technology Department of Sichuan, China","award":["2018GZ0047"],"award-info":[{"award-number":["2018GZ0047"]}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["ZYGX2019J067"],"award-info":[{"award-number":["ZYGX2019J067"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,11]]},"DOI":"10.1109\/tie.2019.2952782","type":"journal-article","created":{"date-parts":[[2019,11,15]],"date-time":"2019-11-15T20:53:41Z","timestamp":1573851221000},"page":"9703-9714","source":"Crossref","is-referenced-by-count":58,"title":["Natural Crack Diagnosis System Based on Novel L-Shaped Electromagnetic Sensing Thermography"],"prefix":"10.1109","volume":"67","author":[{"given":"Zewei","family":"Liu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3377-6895","authenticated-orcid":false,"given":"Bin","family":"Gao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7563-1523","authenticated-orcid":false,"given":"Gui Yun","family":"Tian","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2010.05.010"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1038\/146446a0"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2008.12.008"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.corsci.2005.05.017"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2282598"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2801809"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2744179"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2479856"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.4790866"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2017.2723432"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2868867"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2006.07.011"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.corsci.2013.09.001"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2492925"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.01.024"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2281162"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.3233\/JAE-162174"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2005.854441"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2011.03.004"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmmm.2011.08.048"},{"key":"ref7","first-page":"269","article-title":"The effect of crack closure on the reliability of NDT predictions of crack size","volume":"20","author":"clark","year":"1987","journal-title":"NDT Int"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.infrared.2015.12.026"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1063\/1.3456996"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/20.996088"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.4963894"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.3362428"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2015.09.011"},{"key":"ref24","first-page":"17","article-title":"Thermo-inductive crack detection","volume":"22","author":"oswald-tranta","year":"2007","journal-title":"Nondestructive Testing Communications"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2574987"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.ndteint.2015.05.006"},{"key":"ref25","article-title":"Asymmetric induction work coil for thermoplastic welding","author":"hansen","year":"1995"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9144648\/08901983.pdf?arnumber=8901983","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:52:45Z","timestamp":1651067565000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8901983\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11]]},"references-count":31,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2952782","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,11]]}}}