{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,7]],"date-time":"2026-05-07T15:52:06Z","timestamp":1778169126577,"version":"3.51.4"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,11,1]],"date-time":"2020-11-01T00:00:00Z","timestamp":1604188800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003009","name":"Science and Technology Development Fund","doi-asserted-by":"publisher","award":["189\/2017\/A3"],"award-info":[{"award-number":["189\/2017\/A3"]}],"id":[{"id":"10.13039\/501100003009","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Research Committee at University of Macau","award":["MYRG2016-00123-FST"],"award-info":[{"award-number":["MYRG2016-00123-FST"]}]},{"name":"Research Committee at University of Macau","award":["MYRG2018-00136-FST"],"award-info":[{"award-number":["MYRG2018-00136-FST"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,11]]},"DOI":"10.1109\/tie.2019.2952823","type":"journal-article","created":{"date-parts":[[2019,11,15]],"date-time":"2019-11-15T20:53:41Z","timestamp":1573851221000},"page":"9715-9723","source":"Crossref","is-referenced-by-count":124,"title":["Classification of Complex Power Quality Disturbances Using Optimized S-Transform and Kernel SVM"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-9935-712X","authenticated-orcid":false,"given":"Qiu","family":"Tang","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3348-1659","authenticated-orcid":false,"given":"Wei","family":"Qiu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4487-6384","authenticated-orcid":false,"given":"Yicong","family":"Zhou","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2017.2761239"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.1986.1143830"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2558200"},{"key":"ref30","year":"2009","journal-title":"IEEE Power and Energy Society IEEE Recommended Practice for Monitoring Electric Power Quality"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2016.10.013"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2864446"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2016.01.003"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2521615"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2014.12.015"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2018.2879522"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2013.02.012"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2356639"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2803042"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2624313"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2016.2578518"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2014.04.015"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2013.2278865"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2015.2429682"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2016.2626469"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/78.492555"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2272276"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2015.2397431"},{"key":"ref29","first-page":"30","article-title":"Numerical model framework of power quality events","volume":"43","author":"tan","year":"2010","journal-title":"Eur J Sci Res"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"494","DOI":"10.1109\/TPWRD.2009.2034832","article-title":"Time-Frequency analysis of power quality disturbances via the Gabor-Wigner transform","volume":"25","author":"cho","year":"2010","journal-title":"IEEE Trans Power Del"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijepes.2014.03.010"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2758745"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2785321"},{"key":"ref9","author":"mohanty","year":"0","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2711565"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2018.09.160"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2773475"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2871253"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2011.2149547"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICHQP.2018.8378873"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.dsp.2015.07.003"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/S0165-1684(00)00236-X"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9144648\/08902208.pdf?arnumber=8902208","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:52:44Z","timestamp":1651067564000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8902208\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,11]]},"references-count":36,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2952823","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2020,11]]}}}