{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,20]],"date-time":"2025-11-20T06:37:41Z","timestamp":1763620661952,"version":"3.37.3"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,12,1]],"date-time":"2020-12-01T00:00:00Z","timestamp":1606780800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61833014"],"award-info":[{"award-number":["61833014"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2020,12]]},"DOI":"10.1109\/tie.2019.2962468","type":"journal-article","created":{"date-parts":[[2020,1,1]],"date-time":"2020-01-01T20:51:05Z","timestamp":1577911865000},"page":"10876-10886","source":"Crossref","is-referenced-by-count":12,"title":["Generalized Semisupervised Self-Optimizing Kernel Model for Quality-Related Industrial Process Monitoring"],"prefix":"10.1109","volume":"67","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1267-2763","authenticated-orcid":false,"given":"Chihang","family":"Wei","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4098-6479","authenticated-orcid":false,"given":"Zhihuan","family":"Song","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(93)80018-I"},{"journal-title":"Taguchi Methods Orthogonal Arrays and Linear Graphs Tools for Quality Engineering","year":"1987","author":"taguchi","key":"ref32"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmatprotec.2008.03.021"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2014.04.045"},{"key":"ref36","first-page":"359","article-title":"Selection of the optimal parameter value for the locally linear embedding algorithm","volume":"2","author":"kouropteva","year":"0","journal-title":"Proc 1st Int Conf Fuzzy Syst Knowl Discovery"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2015.04.012"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/0098-1354(94)00057-U"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.08.011"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2017.06.011"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.2307\/2291207"},{"key":"ref14","first-page":"97","article-title":"Kernel partial least squares regression in reproducing kernel Hilbert space","volume":"2","author":"rosipal","year":"2001","journal-title":"J Mach Learn Res"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2668986"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2016.09.009"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2018.2831901"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2009.04.011"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2014.04.004"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1023\/A:1022602019183"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCST.2018.2865130"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/s10107-004-0560-5"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(02)00161-8"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2016.06.003"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.conengprac.2018.10.017"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2637886"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2509247"},{"key":"ref7","first-page":"398","article-title":"Quality-related fault detection approach based on orthogonal signal correction and modified PLS","volume":"11","author":"wang","year":"2015","journal-title":"IEEE Trans Ind Informat"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.8b02913"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.cherd.2015.01.006"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2017.09.021"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/1015330.1015345"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S0893-6080(99)00032-5"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s11263-005-4939-z"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/72.788641"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2004.841784"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1137\/S1052623497325107"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.ces.2003.09.012"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9174688\/08948339.pdf?arnumber=8948339","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,27]],"date-time":"2022-04-27T13:54:39Z","timestamp":1651067679000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8948339\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,12]]},"references-count":36,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2019.2962468","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2020,12]]}}}