{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,17]],"date-time":"2026-07-17T14:59:10Z","timestamp":1784300350397,"version":"3.55.0"},"reference-count":17,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51520105010"],"award-info":[{"award-number":["51520105010"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51807076"],"award-info":[{"award-number":["51807076"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003397","name":"Huazhong University of Science and Technology","doi-asserted-by":"publisher","award":["2019YGSCXCY010"],"award-info":[{"award-number":["2019YGSCXCY010"]}],"id":[{"id":"10.13039\/501100003397","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2021,2]]},"DOI":"10.1109\/tie.2020.2967663","type":"journal-article","created":{"date-parts":[[2020,1,23]],"date-time":"2020-01-23T21:08:35Z","timestamp":1579813715000},"page":"1108-1117","source":"Crossref","is-referenced-by-count":15,"title":["A Novel Negative-Sequence Current Injection Method for Reducing LVPMM Electromagnetic Thrust Ripple Considering Static Longitudinal End Effect"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4110-3412","authenticated-orcid":false,"given":"Zhi","family":"Chen","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9377-6884","authenticated-orcid":false,"given":"Wubin","family":"Kong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6724-2301","authenticated-orcid":false,"given":"Chaojie","family":"Shi","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6375-0990","authenticated-orcid":false,"given":"Ronghai","family":"Qu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2395-9690","authenticated-orcid":false,"given":"Vincent","family":"Fedida","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2009.2018681"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"953","DOI":"10.1109\/41.793344","article-title":"dual current control scheme for pwm converter under unbalanced input voltage conditions","volume":"46","author":"song","year":"1999","journal-title":"IEEE Transactions on Industrial Electronics"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2190147"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2017.2662059"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2222049"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2508425"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2480757"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2554080"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2656178"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2867903"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2840832"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/IEMDC.2017.8002234"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2499303"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2443096"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2896272"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2478492"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2814014"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9248066\/08967248.pdf?arnumber=8967248","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:49:02Z","timestamp":1652194142000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8967248\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,2]]},"references-count":17,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2020.2967663","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,2]]}}}