{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T00:25:34Z","timestamp":1771547134079,"version":"3.50.1"},"reference-count":19,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003593","name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","doi-asserted-by":"publisher","award":["#472625\/2014-4"],"award-info":[{"award-number":["#472625\/2014-4"]}],"id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003593","name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","doi-asserted-by":"publisher","award":["#384034\/2015-2"],"award-info":[{"award-number":["#384034\/2015-2"]}],"id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003593","name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","doi-asserted-by":"publisher","award":["#422811\/2016-5"],"award-info":[{"award-number":["#422811\/2016-5"]}],"id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003593","name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","doi-asserted-by":"publisher","award":["#431668\/2016-7"],"award-info":[{"award-number":["#431668\/2016-7"]}],"id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003593","name":"Conselho Nacional de Desenvolvimento Cient\u00edfico e Tecnol\u00f3gico","doi-asserted-by":"publisher","award":["#406099\/2016-2"],"award-info":[{"award-number":["#406099\/2016-2"]}],"id":[{"id":"10.13039\/501100003593","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002322","name":"Coordena\u00e7\u00e3o de Aperfei\u00e7oamento de Pessoal de N\u00edvel Superior","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100002322","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Araucária Foundation of Support to the Scientific"},{"DOI":"10.13039\/501100004611","name":"Secret\u00e1rio de Ci\u00eancia, Tecnologia e Ensino Superior, Governo do Estado de Parana","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004611","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Belagrícola"},{"name":"UTFPR"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2021,2]]},"DOI":"10.1109\/tie.2020.2969106","type":"journal-article","created":{"date-parts":[[2020,1,29]],"date-time":"2020-01-29T21:42:02Z","timestamp":1580334122000},"page":"1675-1683","source":"Crossref","is-referenced-by-count":10,"title":["Assessing Active Learning Strategies to Improve the Quality Control of the Soybean Seed Vigor"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1234-2860","authenticated-orcid":false,"given":"Douglas Felipe","family":"Pereira","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9421-9254","authenticated-orcid":false,"given":"Pedro Henrique","family":"Bugatti","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8786-3313","authenticated-orcid":false,"given":"Fabricio Martins","family":"Lopes","sequence":"additional","affiliation":[]},{"given":"Andre Luis Siqueira Marques","family":"de Souza","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4870-4766","authenticated-orcid":false,"given":"Priscila Tiemi Maeda","family":"Saito","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2011.07.013"},{"key":"ref11","author":"neto","year":"1998","journal-title":"The Tetrazolium Test for Soybean Seeds"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2012.21"},{"key":"ref13","first-page":"1","article-title":"Using ensemble decisions and active selection to improve low-cost labeling for multi-view data","author":"rebbapragada","year":"0","journal-title":"Proc Int Conf Mach Learn"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2011.07.012"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/500156.500159"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2013.2255258"},{"key":"ref17","first-page":"27","article-title":"Improving active learning with sharp data reduction","author":"saito","year":"0","journal-title":"Proc 20th WSCG Intl Conf Comput Graphics Visualization Comput Vis"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2014.04.007"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ipl.2017.05.004"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.dib.2018.12.090"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1590\/S2317-15372013000300012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2554850.2555007"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/2851613.2851637"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2015.05.020"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2013.116"},{"key":"ref2","author":"neto","year":"1998","journal-title":"The Tetrazolium Test for Soybean Seeds"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.15258\/sst.2003.31.3.19"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1371\/journal.pone.0129947"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9248066\/08974615.pdf?arnumber=8974615","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:48:58Z","timestamp":1652194138000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8974615\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,2]]},"references-count":19,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2020.2969106","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,2]]}}}