{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,11]],"date-time":"2026-03-11T17:14:06Z","timestamp":1773249246838,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,2,1]],"date-time":"2021-02-01T00:00:00Z","timestamp":1612137600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973023"],"award-info":[{"award-number":["61973023"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61573050"],"award-info":[{"award-number":["61573050"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61473025"],"award-info":[{"award-number":["61473025"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shandong Key Laboratory of Big-data Driven Safety Control Technology for Complex Systems","award":["SKDK202001"],"award-info":[{"award-number":["SKDK202001"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2021,2]]},"DOI":"10.1109\/tie.2020.2970664","type":"journal-article","created":{"date-parts":[[2020,2,5]],"date-time":"2020-02-05T22:37:14Z","timestamp":1580942234000},"page":"1604-1614","source":"Crossref","is-referenced-by-count":26,"title":["A Dual Robustness Projection to Latent Structure Method and Its Application"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1589-7423","authenticated-orcid":false,"given":"Jinglin","family":"Zhou","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shunli","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6847-8452","authenticated-orcid":false,"given":"Jing","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2003.09.004"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2014.05.014"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/S0098-1354(97)00262-7"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1198\/106186006X113430"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.008"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.5b00567"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2013.07.001"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-7439(99)00061-1"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.5b02559"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.7b00248"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1021\/acs.iecr.7b04554"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2018.2842920"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2018.2822281"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ress.2018.11.009"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2019.2905223"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2698358"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2521734"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2861749"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2008.114"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2013.08.011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.3390\/a11070090"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2308133"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/SYSTOL.2010.5676031"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2011.07.009"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2301773"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.chemolab.2014.04.001"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1002\/aic.11617"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jprocont.2012.06.009"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1021\/ie102564d"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.arcontrol.2012.09.004"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.aca.2004.01.004"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1080\/03610926.2011.620213"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1214\/088342307000000087"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.17713\/ajs.v34i2.406"},{"key":"ref23","author":"fortuna","year":"2007","journal-title":"Soft Sensors for Monitoring and Control of Industrial Processes"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4471-0481-0"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.isatra.2019.01.008"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9248066\/08984717.pdf?arnumber=8984717","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:48:57Z","timestamp":1652194137000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8984717\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,2]]},"references-count":37,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2020.2970664","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,2]]}}}