{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,27]],"date-time":"2026-06-27T12:22:20Z","timestamp":1782562940731,"version":"3.54.5"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2021,4,1]],"date-time":"2021-04-01T00:00:00Z","timestamp":1617235200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,1]],"date-time":"2021-04-01T00:00:00Z","timestamp":1617235200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,1]],"date-time":"2021-04-01T00:00:00Z","timestamp":1617235200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100014103","name":"Key Technology Research and Development Program of Shandong","doi-asserted-by":"publisher","award":["GG201703140154"],"award-info":[{"award-number":["GG201703140154"]}],"id":[{"id":"10.13039\/100014103","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["41576011"],"award-info":[{"award-number":["41576011"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61971388"],"award-info":[{"award-number":["61971388"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U1706218"],"award-info":[{"award-number":["U1706218"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2021,4]]},"DOI":"10.1109\/tie.2020.2977553","type":"journal-article","created":{"date-parts":[[2020,3,6]],"date-time":"2020-03-06T22:12:51Z","timestamp":1583532771000},"page":"3588-3598","source":"Crossref","is-referenced-by-count":77,"title":["Few-Shot Learning for Domain-Specific Fine-Grained Image Classification"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1870-9037","authenticated-orcid":false,"given":"Xin","family":"Sun","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5881-2237","authenticated-orcid":false,"given":"Hongwei","family":"Xv","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7012-2087","authenticated-orcid":false,"given":"Junyu","family":"Dong","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Huiyu","family":"Zhou","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1324-7454","authenticated-orcid":false,"given":"Changrui","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Qiong","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","first-page":"1126","article-title":"Model-Agnostic meta-learning for fast adaptation of deep networks","author":"finn","year":"0","journal-title":"Proc Int Conf Mach Learn"},{"key":"ref38","article-title":"Few-Shot learning with metric-agnostic conditional embeddings","author":"hilliard","year":"2018"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00136"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2487575.2487591"},{"key":"ref31","article-title":"Higher-order occurrence pooling on mid- and low-level features: Visual concept detection","author":"koniusz","year":"2013"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.63"},{"key":"ref37","article-title":"The Caltech-UCSD Birds-200-2011 dataset","author":"wah","year":"2011"},{"key":"ref36","article-title":"Siamese neural networks for one-shot image recognition","author":"koch","year":"0","journal-title":"Proc Int Conf Mach Learn Deep Learn Workshop"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2019.2910052"},{"key":"ref34","article-title":"Network in network","author":"lin","year":"0","journal-title":"Proc Int Conf Learn Representations"},{"key":"ref10","article-title":"Learning deep relations to promote saliency detection","author":"chen","year":"0","journal-title":"Proc AAAI Conf Artif Intell"},{"key":"ref40","article-title":"Few-Shot learning with graph neural networks","author":"garcia","year":"0","journal-title":"Proc Int Conf Learn Representations"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2327558"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1093\/plankt\/fbp124"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.3354\/ame01539"},{"key":"ref14","article-title":"Low-rank pairwise alignment bilinear network for few-shot fine-grained image classification","author":"huang","year":"2019"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICME.2019.00024"},{"key":"ref16","article-title":"Cross-modal hallucination for few-shot fine-grained recognition","author":"pahde","year":"2018"},{"key":"ref17","article-title":"A two-stage approach to few-shot learning for image recognition","author":"das","year":"2019","journal-title":"IEEE Trans Image Process"},{"key":"ref18","first-page":"1988","article-title":"DeepID2: Deep learning face representation by joint identification-verification","author":"sun","year":"0","journal-title":"Proc Conf Neural Inf Process Syst"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2005.202"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00610"},{"key":"ref4","first-page":"3630","article-title":"Matching networks for one shot learning","author":"vinyals","year":"0","journal-title":"Proc Conference on Neural Information Processing Systems"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-12939-2_27"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1126\/science.aab3050"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00131"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref5","first-page":"4077","article-title":"Prototypical networks for few-shot learning","author":"snell","year":"0","journal-title":"Proc Conf Neural Inf Process Syst"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2902817"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00459"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2165451"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"6538","DOI":"10.1109\/TIE.2017.2784394","article-title":"Automatic pearl classification machine based on multi-stream convolutional neural network","volume":"65","author":"qi","year":"2018","journal-title":"IEEE Trans Ind Electron"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.322"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2015.7298891"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46478-7_31"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.180"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1093\/icesjms\/fsz171"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2018.10.022"},{"key":"ref41","article-title":"Git loss for deep face recognition","author":"calefati","year":"0","journal-title":"Proc Brit Mach Vision Conf"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00779"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1038\/326655a0"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.74"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9296386\/09027090.pdf?arnumber=9027090","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:49:49Z","timestamp":1652194189000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9027090\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4]]},"references-count":42,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2020.2977553","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,4]]}}}