{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T23:56:20Z","timestamp":1780444580545,"version":"3.54.1"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2021,6,1]],"date-time":"2021-06-01T00:00:00Z","timestamp":1622505600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by\/4.0\/legalcode"}],"funder":[{"name":"Tiina ja Antti Herlin Foundation in Finland"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2021,6]]},"DOI":"10.1109\/tie.2020.2988235","type":"journal-article","created":{"date-parts":[[2020,4,27]],"date-time":"2020-04-27T23:56:57Z","timestamp":1588031817000},"page":"4916-4926","source":"Crossref","is-referenced-by-count":77,"title":["Novel Fitting Algorithm for Parametrization of Equivalent Circuit Model of Li-Ion Battery From Broadband Impedance Measurements"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2352-2368","authenticated-orcid":false,"given":"Jussi","family":"Sihvo","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6822-6482","authenticated-orcid":false,"given":"Tomi","family":"Roinila","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2938-8921","authenticated-orcid":false,"given":"Daniel-Ioan","family":"Stroe","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"242","DOI":"10.1016\/j.jelechem.2017.06.008","article-title":"Solving CNLS problems by using Levenberg-Marquardt algorithm: A new approach to avoid off-limits values during a fit","volume":"799","author":"\u017eic","year":"2017","journal-title":"J Electroanalytical Chem"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.04.099"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7753(02)00443-3"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2018.8341584"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2017.10.019"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2019.8927338"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-8933-7"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/S0378-7753(99)00385-7"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1149\/2.1021810jes"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2607519"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2018.11.020"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.01.097"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVT.2018.2880085"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2798606"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2014.6954027"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2782691"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2015.10.025"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.rser.2015.11.042"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1002\/SERIES1345"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2775179"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2311389"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2002.802243"},{"key":"ref21","author":"godfrey","year":"1993","journal-title":"Perturbation Signals for System Identification"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2924286"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2860543"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2017.8001379"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2005.01.006"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9358061\/09078865.pdf?arnumber=9078865","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T15:59:50Z","timestamp":1642003190000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9078865\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,6]]},"references-count":27,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tie.2020.2988235","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,6]]}}}