{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,26]],"date-time":"2025-11-26T16:33:34Z","timestamp":1764174814949,"version":"3.37.3"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2021,8,1]],"date-time":"2021-08-01T00:00:00Z","timestamp":1627776000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,8,1]],"date-time":"2021-08-01T00:00:00Z","timestamp":1627776000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,8,1]],"date-time":"2021-08-01T00:00:00Z","timestamp":1627776000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2021,8]]},"DOI":"10.1109\/tie.2020.3007088","type":"journal-article","created":{"date-parts":[[2020,7,10]],"date-time":"2020-07-10T20:15:46Z","timestamp":1594412146000},"page":"7526-7534","source":"Crossref","is-referenced-by-count":16,"title":["Estimation of Parasitic Capacitance of Common Mode Noise in Vehicular Applications: An Unscented Kalman Filter-Based Approach"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0773-6753","authenticated-orcid":false,"given":"Sepehr","family":"Karimi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6505-4021","authenticated-orcid":false,"given":"Ebrahim","family":"Farjah","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2185-5388","authenticated-orcid":false,"given":"Teymoor","family":"Ghanbari","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5981-8307","authenticated-orcid":false,"given":"Farshid","family":"Naseri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1080-2010","authenticated-orcid":false,"given":"Jean-Luc","family":"Schanen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2017.2695568"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2941151"},{"key":"ref33","article-title":"An experimental and numerical study of the humidity effect on the stability of a capacitive ceramic pressure sensor","volume":"21","author":"zarnik","year":"2012","journal-title":"Radio"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/33.16649"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2317172"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2007.902191"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2823689"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.917063"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2016.2533539"},{"key":"ref34","first-page":"160","author":"paul","year":"1994","journal-title":"Analysis of Multiconductor Transmission Lines"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/APEMC.2015.7175395"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2895802"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CPE.2011.5942277"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IECON.2009.5414678"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2005.857365"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2984438"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2019.2954360"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2957358"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2891120"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2221747"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/PEDSTC.2019.8697677"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.2136\/vzj2006.0188"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2295053"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/19.2677"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2956771"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/GEMCCON.2018.8628475"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/LSENS.2019.2943503"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2162100"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2008.2002090"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2007.900503"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2945931"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2011.2155660"},{"journal-title":"Introduction to Electromagnetic Compatibility","year":"2006","author":"paul","key":"ref1"},{"key":"ref20","first-page":"1255","article-title":"Influence of parasitic parameters on switching characteristics and layout design considerations of SiC MOSFETs","volume":"18","author":"qin","year":"2018","journal-title":"J Power Electron"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2221747"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/electronics7080126"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2224071"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/63.849051"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1002\/0470045345"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/63.774198"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2016.2533539"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2011.2155660"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/15.748137"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2953351"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9420632\/09138791.pdf?arnumber=9138791","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:49:31Z","timestamp":1652194171000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9138791\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,8]]},"references-count":44,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2020.3007088","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2021,8]]}}}