{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T16:53:55Z","timestamp":1779382435315,"version":"3.53.1"},"reference-count":46,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2021,9,1]],"date-time":"2021-09-01T00:00:00Z","timestamp":1630454400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,9,1]],"date-time":"2021-09-01T00:00:00Z","timestamp":1630454400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,9,1]],"date-time":"2021-09-01T00:00:00Z","timestamp":1630454400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003725","name":"National Research Foundation of Korea","doi-asserted-by":"publisher","award":["NRF-2019R1A2C1084104"],"award-info":[{"award-number":["NRF-2019R1A2C1084104"]}],"id":[{"id":"10.13039\/501100003725","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2021,9]]},"DOI":"10.1109\/tie.2020.3016241","type":"journal-article","created":{"date-parts":[[2020,8,20]],"date-time":"2020-08-20T19:56:40Z","timestamp":1597953400000},"page":"7874-7883","source":"Crossref","is-referenced-by-count":47,"title":["Reliable Flux-Based Detection of Induction Motor Rotor Faults From the Fifth Rotor Rotational Frequency Sideband"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0736-5040","authenticated-orcid":false,"given":"Sang Bin","family":"Lee","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jaehoon","family":"Shin","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5006-0234","authenticated-orcid":false,"given":"Yonghyun","family":"Park","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1203-2600","authenticated-orcid":false,"given":"Heonyoung","family":"Kim","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jongwan","family":"Kim","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2003212"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1049\/ip-b.1986.0019"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2962470"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2109340"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2870265"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2628718"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2931274"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096576"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2163285"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/28.120226"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2331027"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880670"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/63.849047"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2161252"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2508423"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/PTC.2003.1304324"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2032622"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2008.2011341"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2012.2210173"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2672526"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2391432"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2745408"},{"key":"ref4","article-title":"Squirrel cage rotor testing","author":"bishop","year":"2003","journal-title":"Proc EASA Conv"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2905832"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2885719"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/2943.930988"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2361115"},{"key":"ref5","doi-asserted-by":"crossref","DOI":"10.1002\/9781118886663","author":"stone","year":"2014","journal-title":"Electrical Insulation for Rotating Machines Design Evaluation Aging Testing and Repair"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2002.800591"},{"key":"ref7","first-page":"1236","article-title":"On-line current monitoring—The influence of mechanical loads or a unique rotor design on the diagnosis of broken rotor bars in induction motors","author":"thomson","year":"1992","journal-title":"Proc Int Conf Elect Mach"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MIA.2002.1011184"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2013.2297448"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/28.936414"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.3000461"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2464301"},{"key":"ref45","author":"wowk","year":"1991","journal-title":"Machinery Vibration—Measurements and Analysis"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2821645"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2767540"},{"key":"ref42","year":"2018"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2883260"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/DEMPED.2019.8864863"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2866104"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/28.567073"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2891453"},{"key":"ref43","year":"0"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2891468"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9459470\/09172040.pdf?arnumber=9172040","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,10,6]],"date-time":"2023-10-06T03:20:19Z","timestamp":1696562419000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9172040\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,9]]},"references-count":46,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2020.3016241","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,9]]}}}