{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,10]],"date-time":"2026-04-10T10:04:39Z","timestamp":1775815479533,"version":"3.50.1"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51675229"],"award-info":[{"award-number":["51675229"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51975250"],"award-info":[{"award-number":["51975250"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Scientific Research Foundation for Leading Professor Program of Jilin University","award":["419080500171"],"award-info":[{"award-number":["419080500171"]}]},{"name":"Scientific Research Foundation for Leading Professor Program of Jilin University","award":["419080500264"],"award-info":[{"award-number":["419080500264"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2021,12]]},"DOI":"10.1109\/tie.2020.3037988","type":"journal-article","created":{"date-parts":[[2020,11,20]],"date-time":"2020-11-20T03:34:33Z","timestamp":1605843273000},"page":"12860-12870","source":"Crossref","is-referenced-by-count":15,"title":["Noninvasive Passive Measurement of Multiphase Currents in IoT"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9389-4781","authenticated-orcid":false,"given":"Ziqi","family":"Zhao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0921-2857","authenticated-orcid":false,"given":"Dong F.","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3718-0474","authenticated-orcid":false,"given":"Yipeng","family":"Hou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toshihiro","family":"Itoh","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ryutaro","family":"Maeda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1088\/0964-1726\/13\/5\/018"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-45678-7_121"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ISGT-Asia.2019.8881558"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2019.8913095"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0960-1317\/19\/9\/094018"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICSENS.2010.5690649"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.sna.2016.06.022"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/NEMS.2011.6017507"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/mnl.2011.0637"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-012-1535-8"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1049\/mnl.2013.0584"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/24\/12\/125109"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-013-1749-4"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-014-2167-y"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.protcy.2015.10.034"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/PES.2009.5275282"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2936883"},{"key":"ref3","article-title":"Study of security attributes of smart grid systems—Current cyber security issues","author":"boyer","year":"2009"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2011.11.008"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2015.2402284"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/B978-012170960-0\/50050-5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2015.02.043"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2013.2259791"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1063\/1.4975243"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.4028\/www.scientific.net\/AST.54.350"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1063\/1.5121605"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1063\/1.4965871"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1063\/1.4979787"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1063\/1.4965847"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/28\/1\/015101"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1063\/1.4991074"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2933861"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-018-3882-6"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9526609\/09264736.pdf?arnumber=9264736","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:49:36Z","timestamp":1652194176000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9264736\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12]]},"references-count":33,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2020.3037988","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,12]]}}}