{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,25]],"date-time":"2026-03-25T06:35:38Z","timestamp":1774420538764,"version":"3.50.1"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,12,1]],"date-time":"2021-12-01T00:00:00Z","timestamp":1638316800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100006435","name":"National Science Foundation","doi-asserted-by":"publisher","award":["2015889"],"award-info":[{"award-number":["2015889"]}],"id":[{"id":"10.13039\/100006435","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100006435","name":"National Science Foundation","doi-asserted-by":"publisher","award":["2015889"],"award-info":[{"award-number":["2015889"]}],"id":[{"id":"10.13039\/100006435","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2021,12]]},"DOI":"10.1109\/tie.2020.3047037","type":"journal-article","created":{"date-parts":[[2020,12,31]],"date-time":"2020-12-31T20:39:06Z","timestamp":1609447146000},"page":"12760-12770","source":"Crossref","is-referenced-by-count":29,"title":["L\u00e9vy Process-Based Stochastic Modeling for Machine Performance Degradation Prognosis"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3098-009X","authenticated-orcid":false,"given":"Peng","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Robert X.","family":"Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Wojbor A.","family":"Woyczynski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","article-title":"Bearing data set","author":"lee","year":"2007"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijfatigue.2013.08.019"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1115\/1.4032680"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2013.06.001"},{"key":"ref31","author":"bertoin","year":"1996","journal-title":"Lévy Processes"},{"key":"ref30","article-title":"Lectures on diffiusive processes and stochastic differential equations","author":"woyczynski","year":"2015"},{"key":"ref37","first-page":"792","article-title":"NASGRO 3.0: A software for analyzing aging aircraft","author":"mettu","year":"1999","journal-title":"Proc 2nd Joint NASA\/FAA\/DoD Conf Aging Aircr"},{"key":"ref36","author":"spiegelhalter","year":"1995","journal-title":"Markov Chain Monte Carlo in Practice"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2182221"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2010.11.018"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838078"},{"key":"ref40","first-page":"1","article-title":"PRONOSTIA: An experimental platform for bearings accelerated degradation tests","author":"nectoux","year":"2012","journal-title":"Proc Int Conf Prognostics Health Manage"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2455055"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2733487"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2393840"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2336616"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2739709"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2009.2033734"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2799853"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2933854"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2010.2103710"},{"key":"ref28","author":"kyprianou","year":"2006","journal-title":"Fluctuations of Lévy Processes with Applications Introductory Lectures"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2015.05.011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.est.2018.07.004"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2017.04.012"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2959492"},{"key":"ref29","first-page":"5936","article-title":"Lévy process-based stochastic modeling for machine performance degradation prognosis","author":"wang","year":"2018","journal-title":"Proc 44th Annu Conf IEEE Ind Electron Soc"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2924605"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2684821"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2677334"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmapro.2017.04.014"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2813964"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2194173"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2170253"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2016.06.031"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2017.2785978"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3233\/JIFS-169544"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.11.016"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3390\/s19061472"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2774261"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2018.2829844"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1080\/00207721.2013.775378"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.probengmech.2015.01.001"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1007\/s10845-015-1110-0"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1115\/MSEC2018-6638"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/41\/9526609\/9311875-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9526609\/09311875.pdf?arnumber=9311875","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:49:41Z","timestamp":1652194181000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9311875\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,12]]},"references-count":45,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tie.2020.3047037","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,12]]}}}