{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T09:59:41Z","timestamp":1740131981434,"version":"3.37.3"},"reference-count":25,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,1,1]],"date-time":"2022-01-01T00:00:00Z","timestamp":1640995200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51877130"],"award-info":[{"award-number":["51877130"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100013290","name":"National Key Research and Development Program of China Stem Cell and Translational Research","doi-asserted-by":"publisher","award":["2017YFGH001164"],"award-info":[{"award-number":["2017YFGH001164"]}],"id":[{"id":"10.13039\/501100013290","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Bilateral and Multilateral Research &amp; Technology Co-operation between Greece and China","award":["2017YFGH001164","eSOLAR\/T7\u0394KI-00066"],"award-info":[{"award-number":["2017YFGH001164","eSOLAR\/T7\u0394KI-00066"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,1]]},"DOI":"10.1109\/tie.2021.3053881","type":"journal-article","created":{"date-parts":[[2021,1,28]],"date-time":"2021-01-28T20:48:57Z","timestamp":1611866937000},"page":"18-28","source":"Crossref","is-referenced-by-count":11,"title":["Autoidentification Method of the \u201cTrouble Maker(s)\u201d for Internal Instability in Multiparalleled Inverters System"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1567-7917","authenticated-orcid":false,"given":"Weimin","family":"Wu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zhijun","family":"Zhao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1285-8840","authenticated-orcid":false,"given":"Eftichis","family":"Koutroulis","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4890-8256","authenticated-orcid":false,"given":"Henry Shu-Hung","family":"Chung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8311-7412","authenticated-orcid":false,"given":"Frede","family":"Blaabjerg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2004.833453"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2161337"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2714143"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2279206"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2136439"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2588458"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2793242"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2864775"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2095429"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2195032"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2014.2352931"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2914560"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2685363"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2018.2812712"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2935806"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2585547"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2881139"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2890842"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2278716"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2838058"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2917533"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2803846"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2306432"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2956064"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2419712"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9557856\/09339935.pdf?arnumber=9339935","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T23:20:42Z","timestamp":1704842442000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9339935\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,1]]},"references-count":25,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3053881","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2022,1]]}}}