{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,28]],"date-time":"2026-02-28T17:43:57Z","timestamp":1772300637064,"version":"3.50.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100013290","name":"National Key Research and Development Program of China Stem Cell and Translational Research","doi-asserted-by":"publisher","award":["2018YFB0104501"],"award-info":[{"award-number":["2018YFB0104501"]}],"id":[{"id":"10.13039\/501100013290","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51977095"],"award-info":[{"award-number":["51977095"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,2]]},"DOI":"10.1109\/tie.2021.3055165","type":"journal-article","created":{"date-parts":[[2021,2,3]],"date-time":"2021-02-03T05:07:19Z","timestamp":1612328839000},"page":"1276-1287","source":"Crossref","is-referenced-by-count":14,"title":["Dual-Inverter PWM Scheme for DC-Biased Vernier Reluctance Machines With Reduced Switching Frequency Capable of Zero-Sequence Current Regulation"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-3959-6967","authenticated-orcid":false,"given":"Zixiang","family":"Yu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9377-6884","authenticated-orcid":false,"given":"Wubin","family":"Kong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6375-0990","authenticated-orcid":false,"given":"Ronghai","family":"Qu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zimin","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9048-5229","authenticated-orcid":false,"given":"Dawei","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.1986.4504786"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2030211"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2464173"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2008.921406"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2309726"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1049\/iet-rpg.2014.0414"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2912779"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2512521"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/28.363044"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2002.803582"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2538773"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2315505"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2015.2490041"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2811719"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2016.2572659"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2846622"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/28.649972"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICELMACH.2014.6960294"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2653194"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.1997.648991"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2005.1581721"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2004.826514"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2366715"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2896222"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/28.108456"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/63.737592"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2977579"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2336614"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9594638\/09345481.pdf?arnumber=9345481","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T23:51:27Z","timestamp":1704844287000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9345481\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,2]]},"references-count":28,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3055165","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,2]]}}}