{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,21]],"date-time":"2026-05-21T16:37:25Z","timestamp":1779381445417,"version":"3.53.1"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100013290","name":"National Key Research and Development Program of China Stem Cell and Translational Research","doi-asserted-by":"publisher","award":["2017YFE0112100"],"award-info":[{"award-number":["2017YFE0112100"]}],"id":[{"id":"10.13039\/501100013290","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61925304"],"award-info":[{"award-number":["61925304"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62003116"],"award-info":[{"award-number":["62003116"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,2]]},"DOI":"10.1109\/tie.2021.3057040","type":"journal-article","created":{"date-parts":[[2021,2,10]],"date-time":"2021-02-10T08:01:31Z","timestamp":1612944091000},"page":"1654-1662","source":"Crossref","is-referenced-by-count":16,"title":["Torsional Harmonic Kelvin Probe Force Microscopy for High-Sensitivity Mapping of Surface Potential"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1896-9859","authenticated-orcid":false,"given":"Hao","family":"Zhang","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6501-656X","authenticated-orcid":false,"given":"Haibo","family":"Gao","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5800-5881","authenticated-orcid":false,"given":"Junyuan","family":"Geng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4924-4132","authenticated-orcid":false,"given":"Xianghe","family":"Meng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4299-2776","authenticated-orcid":false,"given":"Hui","family":"Xie","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1021\/nn700190t"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.200701142"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.surfrep.2010.10.001"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-4332(02)01484-8"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1063\/1.4723697"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1063\/1.1144209"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/S0006-3495(93)81171-8"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1002\/jemt.22741"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2008.01.003"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1063\/1.4873331"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2010.2040483"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/22\/7\/075501"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2015.2413779"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2013.2283409"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.818334"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1126\/sciadv.aay6913"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-018-04016-y"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1063\/1.105227"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201700749"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.5b01429"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/adfm.201904576"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1080\/10584587.2017.1352411"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.precisioneng.2019.02.011"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1021\/acs.langmuir.6b04572"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2548441"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2910042"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.64.245403"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1177\/0278364908097212"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2013.2280831"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TRO.2014.2367331"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMECH.2018.2816957"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2012.2215853"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/micronano.2016.24"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/19\/23\/235704"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/S0169-4332(99)00536-X"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1143\/JJAP.40.4314"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1063\/1.4913910"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.71.125424"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1063\/1.368181"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.7b02114"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/27\/24\/245705"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9594638\/09351769.pdf?arnumber=9351769","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:04:51Z","timestamp":1649441091000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9351769\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,2]]},"references-count":41,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3057040","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,2]]}}}