{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,24]],"date-time":"2026-07-24T15:25:10Z","timestamp":1784906710290,"version":"3.55.0"},"reference-count":41,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,2,1]],"date-time":"2022-02-01T00:00:00Z","timestamp":1643673600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52072038"],"award-info":[{"award-number":["52072038"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,2]]},"DOI":"10.1109\/tie.2021.3063968","type":"journal-article","created":{"date-parts":[[2021,3,10]],"date-time":"2021-03-10T21:00:52Z","timestamp":1615410052000},"page":"1988-1999","source":"Crossref","is-referenced-by-count":143,"title":["Disturbance-Immune and Aging-Robust Internal Short Circuit Diagnostic for Lithium-Ion Battery"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8419-3158","authenticated-orcid":false,"given":"Jian","family":"Hu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2874-1858","authenticated-orcid":false,"given":"Hongwen","family":"He","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0051-5648","authenticated-orcid":false,"given":"Zhongbao","family":"Wei","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9497-3051","authenticated-orcid":false,"given":"Yang","family":"Li","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MPE.2017.2708812"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1016\/j.ensm.2017.05.013"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2941747"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2899565"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2019.227275"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1039\/C7EE00385D"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2013.09.145"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2018.8557475"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2016.11.007"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2018.05.097"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2019.114170"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.06.052"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2017.04.002"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2013.05.048"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.06.087"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2838109"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.energy.2018.10.160"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2015.10.019"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.3390\/en10010076"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2016.10.026"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/en11010125"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2948253"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2916389"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2020.115494"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2677319"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2962429"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2880668"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2859317"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2017.2699288"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2017.02.016"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2795521"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2015.2424673"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2736480"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2014.2301135"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2020.114932"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/B978-1-78242-377-5.00011-X"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2012.10.060"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2019.114143"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2010.12.107"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2015.04.148"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.jpowsour.2011.10.013"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9594638\/09374788.pdf?arnumber=9374788","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T22:54:45Z","timestamp":1704840885000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9374788\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,2]]},"references-count":41,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3063968","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,2]]}}}