{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T15:55:51Z","timestamp":1774626951717,"version":"3.50.1"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T00:00:00Z","timestamp":1648771200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T00:00:00Z","timestamp":1648771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T00:00:00Z","timestamp":1648771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,4]]},"DOI":"10.1109\/tie.2021.3075854","type":"journal-article","created":{"date-parts":[[2021,5,3]],"date-time":"2021-05-03T20:13:30Z","timestamp":1620072810000},"page":"3334-3344","source":"Crossref","is-referenced-by-count":24,"title":["Design of Frequency-Adaptive Flux Observer in PMSM Drives Robust to Discretization Error"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5465-5991","authenticated-orcid":false,"given":"Jiwon","family":"Yoo","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9949-5730","authenticated-orcid":false,"given":"Hyeon-Sik","family":"Kim","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8032-4491","authenticated-orcid":false,"given":"Seung-Ki","family":"Sul","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2003.814996"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.23919\/ICPE2019-ECCEAsia42246.2019.8797313"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3019568"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2018.8557803"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/63.654966"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2018.8558379"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2984189"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3028084"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2904567"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2020.3032463"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/ICPE2019-ECCEAsia42246.2019.8796876"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.813726"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2158238"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/41.141626"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/63.838104"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2864322"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2011.2154293"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/PESC.2005.1581979"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/28.273627"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2920691"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2524644"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2014.2298554"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2623668"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2620428"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2822769"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2013.2296596"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2016.2604299"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/pesc.2006.1711988"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2041256"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2003.810660"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/28.845057"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2388200"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/28.85485"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2010.2057395"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2012.2192451"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9660828\/09422182.pdf?arnumber=9422182","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,9]],"date-time":"2024-01-09T23:44:04Z","timestamp":1704843844000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9422182\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,4]]},"references-count":35,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3075854","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,4]]}}}