{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,18]],"date-time":"2025-12-18T14:15:17Z","timestamp":1766067317087,"version":"3.37.3"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51877165","U1966602"],"award-info":[{"award-number":["51877165","U1966602"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Joint Fund of the Ministry of Education for Equipment Preresearch","award":["6141A02022527"],"award-info":[{"award-number":["6141A02022527"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,5]]},"DOI":"10.1109\/tie.2021.3078401","type":"journal-article","created":{"date-parts":[[2021,5,20]],"date-time":"2021-05-20T19:27:55Z","timestamp":1621538875000},"page":"5050-5059","source":"Crossref","is-referenced-by-count":14,"title":["Development of a Hybrid Fault Current Limiter Using Liquid Metal for Large Capacity MVdc Power Systems"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6939-7980","authenticated-orcid":false,"given":"Beibei","family":"Wang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Chunping","family":"Niu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4022-635X","authenticated-orcid":false,"given":"Hailong","family":"He","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2338-0862","authenticated-orcid":false,"given":"Yi","family":"Wu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3977-6298","authenticated-orcid":false,"given":"Mingzhe","family":"Rong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Longlong","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7132-9853","authenticated-orcid":false,"given":"Jiaze","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","first-page":"1","article-title":"Development of a test protocol for a 15\ufffdkV class solid-state current limiter","author":"sundaram","year":"2009","journal-title":"Proc 20th Int Conf Exhib Elect Distrib -Part 1"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2256801"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2757439"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/61.754084"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1063\/1.4899246"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2174804"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2263773"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2010.2099636"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2012.2187221"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2008.920785"},{"key":"ref18","first-page":"167","article-title":"Liquid metal current limiters","author":"kr\u00e4tzschmar","year":"2000","journal-title":"Proc 20th Int Conf Elect Contacts"},{"key":"ref19","first-page":"272","article-title":"Physical effect and arc characteristics of liquid metal current limiters","author":"berger","year":"2001","journal-title":"Proc 9th Int Conf Switching Arc Phenomena"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/DEIV.2014.6961710"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2803778"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2018.2813139"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2016.2638921"},{"key":"ref6","first-page":"1","article-title":"State of the art of fault current limiters and their applications in smart grid","author":"zhang","year":"0","journal-title":"Proc IEEE Power Energy Soc General Meeting"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TDEI.2015.005167"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2878191"},{"year":"2012","key":"ref8","article-title":"Application and feasibility of fault current limiters in power systems"},{"year":"2003","key":"ref7","article-title":"Fault current limiters in electrical medium and high voltage systems"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2724145"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/28.887229"},{"year":"2017","key":"ref1"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1017\/S0022112004002952"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAPT.2006.875880"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s11630-008-0261-0"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2016.2634591"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2013.2258178"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRD.2019.2892501"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2018.2791435"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9675838\/09437728.pdf?arnumber=9437728","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:04:35Z","timestamp":1649441075000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9437728\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5]]},"references-count":31,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3078401","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"type":"print","value":"0278-0046"},{"type":"electronic","value":"1557-9948"}],"subject":[],"published":{"date-parts":[[2022,5]]}}}