{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,30]],"date-time":"2026-06-30T21:15:59Z","timestamp":1782854159253,"version":"3.54.5"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,7,1]],"date-time":"2022-07-01T00:00:00Z","timestamp":1656633600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100007162","name":"Guangdong Science and Technology Department","doi-asserted-by":"publisher","award":["2017B010113002"],"award-info":[{"award-number":["2017B010113002"]}],"id":[{"id":"10.13039\/501100007162","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Hong Kong Research Impact Fund","award":["R6008-18"],"award-info":[{"award-number":["R6008-18"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,7]]},"DOI":"10.1109\/tie.2021.3102387","type":"journal-article","created":{"date-parts":[[2021,8,10]],"date-time":"2021-08-10T20:02:44Z","timestamp":1628625764000},"page":"6784-6793","source":"Crossref","is-referenced-by-count":44,"title":["Monolithic Integration of Gate Driver and Protection Modules With <i>P<\/i>-GaN Gate Power HEMTs"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0919-6508","authenticated-orcid":false,"given":"Han","family":"Xu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1051-588X","authenticated-orcid":false,"given":"Gaofei","family":"Tang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6124-0110","authenticated-orcid":false,"given":"Jin","family":"Wei","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6455-9300","authenticated-orcid":false,"given":"Zheyang","family":"Zheng","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0659-2022","authenticated-orcid":false,"given":"Kevin J.","family":"Chen","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2017.2657579"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2014.7046965"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2506400"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2015.7409711"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.908601"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2266103"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2852142"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2015.7309976"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2916302"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096395"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.23919\/ISPSD.2017.7988981"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CSICS.2006.319949"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2008.4796635"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2009.5158000"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/APEC.2016.7467930"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CSICS.2010.5619644"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6478997"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/WiPDA.2016.7799940"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2014.2327386"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2396649"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2017.2725908"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268488"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2016.7573496"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISPSD.2018.8393606"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2019.2900154"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3030708"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9063102"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2610460"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2018.07.071"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/28.370271"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2013.2278794"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2007.904237"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/WiPDA.2017.8170560"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2009.2027535"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2014.6953784"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2297304"},{"key":"ref37","article-title":"A CMOS under-voltage lockout circuit","volume-title":"Proc. World Congr. Eng. Comput. Sci.","author":"Hoque","year":"2008"},{"key":"ref38","first-page":"224","article-title":"Design of an under-voltage lockout circuit with bandgap structure","volume-title":"Proc. 12th Int. Symp. Integr. Circuits","author":"Fuhua","year":"2009"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9709233\/09511272.pdf?arnumber=9511272","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T22:39:08Z","timestamp":1705012748000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9511272\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,7]]},"references-count":38,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3102387","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,7]]}}}