{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,3]],"date-time":"2026-06-03T15:32:24Z","timestamp":1780500744312,"version":"3.54.1"},"reference-count":23,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2023,1]]},"DOI":"10.1109\/tie.2021.3102398","type":"journal-article","created":{"date-parts":[[2021,8,10]],"date-time":"2021-08-10T20:02:44Z","timestamp":1628625764000},"page":"522-531","source":"Crossref","is-referenced-by-count":28,"title":["Genetic Algorithm Assisted Parametric Design of Splitting Inductance in High Frequency GaN-Based Dual Active Bridge Converter"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-7487-1317","authenticated-orcid":false,"given":"Chang","family":"Wang","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Technical University of Denmark, Kgs. Lyngby, Denmark"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4271-870X","authenticated-orcid":false,"given":"Tiberiu-Gabriel","family":"Zsurzsan","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Technical University of Denmark, Kgs. Lyngby, Denmark"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8407-3167","authenticated-orcid":false,"given":"Zhe","family":"Zhang","sequence":"additional","affiliation":[{"name":"State Key Lab of Reliability and Intelligence of Electrical Equipment, Hebei University of Technology, Tianjin, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/28.67533"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2988638"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2112312"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2969109"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/OJIES.2020.3023691"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3011470"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ECCE.2017.8096775"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.3024914"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2003.820540"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2574499"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2896235"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2012.2200223"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2883947"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2910597"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2039648"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2009.2027904"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2011.2165734"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2025284"},{"key":"ref19","doi-asserted-by":"crossref","DOI":"10.1142\/6111","author":"Galup-Montoro","year":"2007","journal-title":"MOSFET Model. for Circuit Anal. and Des."},{"key":"ref20","article-title":"Circuit simulation using EPC device models","volume-title":"Application Notes","author":"Beach","year":"2010"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.1980.4308561"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/B978-044452701-1.00039-9"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2017.2682982"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9866919\/09511309.pdf?arnumber=9511309","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:32:34Z","timestamp":1705015954000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9511309\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1]]},"references-count":23,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3102398","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,1]]}}}