{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T00:23:06Z","timestamp":1773102186787,"version":"3.50.1"},"reference-count":32,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,8,1]],"date-time":"2022-08-01T00:00:00Z","timestamp":1659312000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61203060"],"award-info":[{"award-number":["61203060"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012245","name":"Science and Technology Planning Project of Guangdong Province","doi-asserted-by":"publisher","award":["2019A050510015"],"award-info":[{"award-number":["2019A050510015"]}],"id":[{"id":"10.13039\/501100012245","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100021171","name":"Basic and Applied Basic Research Foundation of Guangdong Province","doi-asserted-by":"publisher","award":["2020B1515120071"],"award-info":[{"award-number":["2020B1515120071"]}],"id":[{"id":"10.13039\/501100021171","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["2020ZYGXZR059"],"award-info":[{"award-number":["2020ZYGXZR059"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,8]]},"DOI":"10.1109\/tie.2021.3104584","type":"journal-article","created":{"date-parts":[[2021,8,19]],"date-time":"2021-08-19T19:48:37Z","timestamp":1629402517000},"page":"8452-8462","source":"Crossref","is-referenced-by-count":15,"title":["A CISG Method for Internal Defect Detection of Solar Cells in Different Production Processes"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-4191-5974","authenticated-orcid":false,"given":"Yu","family":"Liu","sequence":"first","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0148-1876","authenticated-orcid":false,"given":"Jiaming","family":"Xu","sequence":"additional","affiliation":[]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1721-1931","authenticated-orcid":false,"given":"Yilin","family":"Wu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MPE.2020.2971824"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2015.2508287"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2018.2809078"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3010212"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2929670"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2822272"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2011.03.025"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.107170"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1016\/j.optlaseng.2019.01.016"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1186\/1687-5281-2014-15"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3096602"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.solmat.2011.12.007"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCPMT.2018.2873744"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2012.2209663"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2010.2092783"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2019.2895808"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2019.2907019"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2020.2988314"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JPHOTOV.2019.2920732"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2900961"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.solener.2019.02.067"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2976843"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.patrec.2018.12.013"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2643600"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2748053"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-003-1832-6"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2917522"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2887145"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-00889-5_1"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2975030"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2975454"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1137\/090771806"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9727184\/09519557.pdf?arnumber=9519557","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:27:31Z","timestamp":1705015651000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9519557\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,8]]},"references-count":32,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3104584","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,8]]}}}