{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,19]],"date-time":"2026-04-19T08:58:19Z","timestamp":1776589099558,"version":"3.51.2"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"LiaoNing Revitalization Talents","award":["XLYC2007107"],"award-info":[{"award-number":["XLYC2007107"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["51677122"],"award-info":[{"award-number":["51677122"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,9]]},"DOI":"10.1109\/tie.2021.3111573","type":"journal-article","created":{"date-parts":[[2021,9,15]],"date-time":"2021-09-15T19:55:50Z","timestamp":1631735750000},"page":"8815-8824","source":"Crossref","is-referenced-by-count":32,"title":["Analytical Model and Experimental Verification of Permanent Magnet Eddy Current Loss in Permanent Magnet Machines With Nonconcentric Magnetic Poles"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-2280-0263","authenticated-orcid":false,"given":"Wenming","family":"Tong","sequence":"first","affiliation":[{"name":"National Engineering Research Center for Rare-earth Permanent Magnet Machines, Shenyang University of Technology, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lu","family":"Sun","sequence":"additional","affiliation":[{"name":"National Engineering Research Center for Rare-earth Permanent Magnet Machines, Shenyang University of Technology, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shengnan","family":"Wu","sequence":"additional","affiliation":[{"name":"National Engineering Research Center for Rare-earth Permanent Magnet Machines, Shenyang University of Technology, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mingjun","family":"Hou","sequence":"additional","affiliation":[{"name":"National Engineering Research Center for Rare-earth Permanent Magnet Machines, Shenyang University of Technology, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Renyuan","family":"Tang","sequence":"additional","affiliation":[{"name":"National Engineering Research Center for Rare-earth Permanent Magnet Machines, Shenyang University of Technology, Shenyang, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2019.2898640"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2500188"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2438637"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2017.2759247"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.2966674"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TASC.2016.2594834"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2019.2895887"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2014.2361861"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2013.2292797"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2018.2874350"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2009.2033195"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2001.971800"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2017.2693178"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1049\/ip-epa:20040546"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2018.2882514"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2272284"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2016.2638477"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2015.2500878"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2017.8056112"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2176696"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2010.2096818"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2547368"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2844795"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2548440"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2014.2354597"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/mca24030067"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ICEMS.2009.5382991"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TMAG.2007.914620"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2477797"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/20.43994"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9749999\/09539054.pdf?arnumber=9539054","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T22:34:55Z","timestamp":1705012495000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9539054\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9]]},"references-count":30,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3111573","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,9]]}}}