{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,8]],"date-time":"2026-05-08T09:52:56Z","timestamp":1778233976198,"version":"3.51.4"},"reference-count":33,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,9,1]],"date-time":"2022-09-01T00:00:00Z","timestamp":1661990400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Ind. Electron."],"published-print":{"date-parts":[[2022,9]]},"DOI":"10.1109\/tie.2021.3114745","type":"journal-article","created":{"date-parts":[[2021,9,29]],"date-time":"2021-09-29T21:27:45Z","timestamp":1632950865000},"page":"8739-8750","source":"Crossref","is-referenced-by-count":39,"title":["Symmetric Cascaded H-Bridge Multilevel Inverter With Enhanced Multi-Phase Fault Tolerant Capability"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8102-6688","authenticated-orcid":false,"given":"Yousef","family":"Neyshabouri","sequence":"first","affiliation":[{"name":"Faculty of Electrical and Computer Engineering, Urmia University, Urmia, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9863-871X","authenticated-orcid":false,"given":"Kourosh K.","family":"Monfared","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1118-2877","authenticated-orcid":false,"given":"Hossein","family":"Iman-Eini","sequence":"additional","affiliation":[{"name":"School of Electrical and Computer Engineering, College of Engineering, University of Tehran, Tehran, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3827-2058","authenticated-orcid":false,"given":"Mohammad","family":"Farhadi-Kangarlu","sequence":"additional","affiliation":[{"name":"Faculty of Electrical and Computer Engineering, Urmia University, Urmia, Iran"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2866115"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2018.2871624"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2935980"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2833055"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2758758"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JESTPE.2019.2916571"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2535481"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2901647"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2032194"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2304561"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2018.5073"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2020.2978716"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2613983"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2509446"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2009.2019771"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2011.2157289"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2016.2632058"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2015.2434995"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2019.2956398"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2019.2950336"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2010.2047407"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2015.2444661"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2016.2633230"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2793182"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2019.1280"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2020.2997306"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2014.2373390"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIA.2019.2959540"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TPEL.2020.2978670"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2018.2823659"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/63.892827"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1049\/iet-pel.2015.1019"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3390\/en14134003"}],"container-title":["IEEE Transactions on Industrial Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/41\/9749999\/09552527.pdf?arnumber=9552527","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T23:27:27Z","timestamp":1705015647000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9552527\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,9]]},"references-count":33,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tie.2021.3114745","relation":{},"ISSN":["0278-0046","1557-9948"],"issn-type":[{"value":"0278-0046","type":"print"},{"value":"1557-9948","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,9]]}}}